Advertisement

Helena: A Physical Modeling for the DC, AC, Noise and Non Linear HEMT Performance

  • H. Happy
  • F. Kapche-Tagne
  • F. Danneville
  • J. Alamkan
  • G. Dambrine
  • A. Cappy
Conference paper

Abstract

A friendly software for the modeling of HEMTs called HELENA for Hemt ELEctrical properties and Noise Analysis is presented. Using this software, the DC, AC, noise and non linear performance of any kind of HEMT realized on either GaAs or InP substrates can be obtained. HELENA is very fast and gives results in a good agreement with experiments.

Keywords

Noise Performance Noise Analysis Gate Leakage Current Reverse Gate Linear Device 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. [1]
    B. Camez and al.- J. Appl. Phys., Vol. 51, Jan. 1980, pp 784–790CrossRefGoogle Scholar
  2. [2]
    A. Cappy and al. - IEEE Trans. on Elec. Dev., Vol.32, No.12 Feb. 1985, pp 2787–2796CrossRefGoogle Scholar
  3. [3]
    P. A. Sandborn and al.: IEEE Trans. on Elec. Dev., Vol. ED-34, No. 5 May 1987Google Scholar
  4. [4]
    C. M. Snowden and al.: IEEE Trans. on Elec. Dev., Vol. 36, No. 9 Sept. 1989CrossRefGoogle Scholar
  5. [5]
    J. Alamkan and al.- European transactions on telecommunications and related technologies, Vol. I, No. 4, July-August 1990Google Scholar
  6. [6]
    A. Cappy, W. Heinrich: IEEE Trans. on Electron Dev., Vol. 36, No. 1 Feb. 1990Google Scholar
  7. [7]
    - W. Shockley and al. In Quantum Theory of Atoms, Molecules and the Solid State. Academic Press, New York, 1966, pp. 537–563.Google Scholar
  8. [8]
    H. Hillbrand and al. - IEEE Trans. on circuits and systems, Vol. cas-23 No. 4 April 1976, pp. 235–238.Google Scholar
  9. [9]
    H. Happy and al.- International Journal of Microwave and Millimeter-Wave Computer-Aided Engineering, Vol. 3, Nο 1, pp. 14–28 (1993)CrossRefGoogle Scholar
  10. [10]
    F. Danneville and al.: MTT Symposium - Atlanta - June 1993.Google Scholar
  11. [11]
    G. Dambrine and al. - Trans. IEEE-MIT, March 1993.Google Scholar

Copyright information

© Springer-Verlag Wien 1993

Authors and Affiliations

  • H. Happy
    • 1
  • F. Kapche-Tagne
    • 1
  • F. Danneville
    • 1
  • J. Alamkan
    • 1
  • G. Dambrine
    • 1
  • A. Cappy
    • 1
  1. 1.Institut d’Electronique et de Microélectronique du NordUniversité des Sciences et Technologies de LilleVilleneuve d’Ascq CédexFrance

Personalised recommendations