Abstract
It will be shown, that critical conditions of the diode in a chopper circuit can be avoided using a multi-step gate drive mode. Moreover, it is demonstrated that the total losses of the chopper circuit can be reduced by an appropriate choice of the hight and length of the gate voltage steps.
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References
H. Schlangenotto, et. al. IEEE Electr. Dev. Let. 10, pp. 322–324, 1989
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H. Schlangenotto, H. Neubrand Arch. Elektrotech. 72, pp. 113–123, 1989
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© 1995 Springer-Verlag Wien
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Gerlach, W., Wiese, U. (1995). Preventing critical conditions in IGBT chopper circuits by a multi-step gate drive mode. In: Ryssel, H., Pichler, P. (eds) Simulation of Semiconductor Devices and Processes. Springer, Vienna. https://doi.org/10.1007/978-3-7091-6619-2_63
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DOI: https://doi.org/10.1007/978-3-7091-6619-2_63
Publisher Name: Springer, Vienna
Print ISBN: 978-3-7091-7363-3
Online ISBN: 978-3-7091-6619-2
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