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Variance and Covariance Estimation in Stationary Monte Carlo Device Simulation

  • H. Kosina
  • M. Nedjalkov
  • S. Selberherr

Abstract

This work deals with the Monte Carlo method for stationary device simulation, known as the Single-Particle Monte Carlo method. A thorough mathematical analysis of this method clearly identifies the independent, identically distributed random variables of the simulated process. Knowledge of these random variables allows usage of straight-forward estimates of the stochastic error. The presented method of error estimation is applicable to both distributed quantities and integrated quantities such as terminal currents.

Keywords

Monte Carlo Particle Density Device Simulation Stochastic Error Free Flight 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. [1]
    C. Jungemann and B. Meinerzhagen, “Efficiency and Stochastic Error of Monte Carlo Device Simulations,” in Int.Electron Devices Meeting, pp. 109–112, 2000.Google Scholar
  2. [2]
    H. Kosina, M. Nedjalkov, and S. Selberherr, “Theory of the Monte Carlo Method for Semiconductor Device Simulation,” IEEE Trans.Electron Devices, vol. 47, no. 10, pp. 1898–1908, 2000.CrossRefGoogle Scholar
  3. [3]
    H. Kosina, M. Nedjalkov, and S. Selberherr, “Variance Reduction in Monte Carlo Device Simulation by Means of Event Biasing,” in Proc. Modeling and Simulation of Microsystems, MSM 2001 (M. Laudon and B. Romanowicz, eds.), pp. 11–14, Computational Publications, Mar. 2001.Google Scholar
  4. [4]
    R. Hockney and J. Eastwood, Computer Simulation Using Particles. Bristol and Philadelphia: Adam Hilger, 1988.MATHCrossRefGoogle Scholar
  5. [5]
    R. Rubinstein, Simulation and the Monte Carlo Method. John Wiley and Sons, 1981.Google Scholar
  6. [6]
    A. Phillips and P. Price, “Monte Carlo Calculations on Hot Electron Tails,” Applied Physics Letters, vol. 30, pp. 528–530, May 1977.CrossRefGoogle Scholar

Copyright information

© Springer-Verlag Wien 2001

Authors and Affiliations

  • H. Kosina
    • 1
  • M. Nedjalkov
    • 1
  • S. Selberherr
    • 1
  1. 1.Institute for MicroelectronicsTU ViennaViennaAustria

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