Abstract
The relative stochastic error of a quantity evaluated by stationary MC simulation is proportional to its variance, which can be evaluated with the corresponding autocorrelation function (cf. Sec. 3.4).
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Jungemann, C., Meinerzhagen, B. (2003). Stochastic Properties of Monte-Carlo Device Simulations. In: Hierarchical Device Simulation. Computational Microelectronics. Springer, Vienna. https://doi.org/10.1007/978-3-7091-6086-2_8
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