Abstract
A combined numerical and analytical model for the voltage measured by a line focus acoustic microscope as it scans the surface of a specimen is described. Particular emphasis is placed upon integration of the various parts into the total measurement model. Specimens having surface-breaking and subsurface cracks are considered as are ones coated by a thin film. The scanning acoustic microscope holds out the promise of quantitative measurements of very localized near surface properties, and of surface and near surface defects whose lengths are of the the order of a few microns.
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References
Achenbach, J.D., V.S. Ahn and J.G. Harris: Wave analysis of the acoustic material signature for the line focus microscope, IEEE Ultrason. Ferroelect. Freq. Contr. 34, (1991) 380–387.
Ahn, V.S., J.G. Harris and J.D. Achenbach: Numerical analysis of he acoustic signature of a surface-breaking crack, IEEE Ultrason. Ferroelect. Freq. Contr. 39 (1991) 112–118.
Ahn, V.S., J.D. Achenbach, Z.L. Li and J.O. Kim: Numerical modeling of the V(z) curve for a thin-layer/substrate configuration, Res. Nondestr. Eval. 3 (1991) 183–200.
Somekh, M.G., H.L. Bertoni, G.A.D. Briggs: A two-dimensional imaging theory of surface discontinuities with the scanning acoustic microscope, Proc. R. Soc. Lond. A 401 (1985) 29–51.
Li, Z.L., J.D. Achenbach and J.O. Kim: Effect of surface discontinuities on V(z) and V(z, Xo) for the line focus acoustic microscope, Wave Motion 14 (1991) 187–203.,
Rebinsky, D.A. and J.G. Harris: An asymptotic calculation of the acoustic material signature of a cracked surface for the line focus scanning acoustic microscope, Proc. R. Soc. Lond. A 436 (1992) 251–265.
Auld, B.A. General electromechanical reciprocity relations applied to the calculation of elastic wave scattering coefficients, Wave Motion 1 (1979) 3–10.
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© 1993 Springer-Verlag Wien
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Achenbach, J.D., Ahn, V.S., Kim, J.O., Harris, J.G. (1993). Numerical Wave Analysis for the Line Focus Acoustic Microscope: A Measurement Model. In: The Evaluation of Materials and Structures by Quantitative Ultrasonics. CISM International Centre for Mechanical Sciences, vol 330. Springer, Vienna. https://doi.org/10.1007/978-3-7091-4315-5_12
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DOI: https://doi.org/10.1007/978-3-7091-4315-5_12
Publisher Name: Springer, Vienna
Print ISBN: 978-3-211-82441-2
Online ISBN: 978-3-7091-4315-5
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