Numerical Wave Analysis for the Line Focus Acoustic Microscope: A Measurement Model
A combined numerical and analytical model for the voltage measured by a line focus acoustic microscope as it scans the surface of a specimen is described. Particular emphasis is placed upon integration of the various parts into the total measurement model. Specimens having surface-breaking and subsurface cracks are considered as are ones coated by a thin film. The scanning acoustic microscope holds out the promise of quantitative measurements of very localized near surface properties, and of surface and near surface defects whose lengths are of the the order of a few microns.
KeywordsBoundary Element Method Rayleigh Wave Crack Depth Particle Displacement Subsurface Crack
Unable to display preview. Download preview PDF.
- 12.2.Ahn, V.S., J.G. Harris and J.D. Achenbach: Numerical analysis of he acoustic signature of a surface-breaking crack, IEEE Ultrason. Ferroelect. Freq. Contr. 39 (1991) 112–118.Google Scholar
- 12.3.Ahn, V.S., J.D. Achenbach, Z.L. Li and J.O. Kim: Numerical modeling of the V(z) curve for a thin-layer/substrate configuration, Res. Nondestr. Eval. 3 (1991) 183–200.Google Scholar