Modeling of Pattern Generating Stochastic Processes

  • Peter W. Becker


In Section 2.2, Steps no. 4 through 7, it was described how a number of N-gram frequencies and delayed digram frequencies are examined to determine their value as potential pattern attributes. This is the general procedure that will be used when little or nothing is known about the processes that generated the library of representative patterns.


Transition Matrix Gaussian Process Binary Sequence Probability Mass Separation Surface 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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Copyright information

© Springer-Verlag Wien 1974

Authors and Affiliations

  • Peter W. Becker
    • 1
  1. 1.Electronics LaboratoryTechnical University of DenmarkLyngbyDenmark

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