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ISS- and SIMS-Analysis of Thin Organic Layers on Metal Surfaces

  • Conference paper
Progress in Materials Analysis

Part of the book series: Mikrochimica Acta ((MIKROCHIMICA,volume 10))

Abstract

Important for the development of industrial degreasing and cleaning products are

  • good knowledge of the special chemical and physical reactions on the surface

  • good knowledge of the materials used and their properties and last but not least

  • experience with plant technology and procedure.

ISS = Ion Scattering Spectrometry

SIMS = Secondary Ion Mass Spectrometry

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Author information

Authors and Affiliations

  1. Analytical Laboratories of Henkel KGaA, Düsseldorf, Federal Republic of Germany

    Dipl.-Phys. Herbert Puderbach

  2. ZR-FE Analytik — Phys. Methoden, Henkel KGaA, Postfach 1100, D-4000, Düsseldorf, Federal Republic of Germany

    Dipl.-Phys. Herbert Puderbach

Authors
  1. Dipl.-Phys. Herbert Puderbach
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Editor information

Editors and Affiliations

  1. Technical University of Vienna, Austria

    M. Grasserbauer (Chairman) (Chairman)

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© 1983 Springer-Verlag Wien

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Puderbach, H. (1983). ISS- and SIMS-Analysis of Thin Organic Layers on Metal Surfaces. In: Grasserbauer, M., Zacherl, M.K. (eds) Progress in Materials Analysis. Mikrochimica Acta, vol 10. Springer, Vienna. https://doi.org/10.1007/978-3-7091-3943-1_8

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  • DOI: https://doi.org/10.1007/978-3-7091-3943-1_8

  • Publisher Name: Springer, Vienna

  • Print ISBN: 978-3-211-81759-9

  • Online ISBN: 978-3-7091-3943-1

  • eBook Packages: Springer Book Archive

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