Advertisement

ISS- and SIMS-Analysis of Thin Organic Layers on Metal Surfaces

  • Herbert Puderbach
Part of the Mikrochimica Acta book series (MIKROCHIMICA, volume 10)

Abstract

Important for the development of industrial degreasing and cleaning products are
  • good knowledge of the special chemical and physical reactions on the surface

  • good knowledge of the materials used and their properties and last but not least

  • experience with plant technology and procedure.

Keywords

Metal Surface Steel Surface Linear Alkyl Benzene Sulfonate Steel Strip Cleaning Product 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    H. Puderbach, Beitr. elektronenmikroskop. Direktabb. Oberfl. 5, 671 (1972).Google Scholar
  2. 2.
    H. Puderbach and R. Schoenemann, Metalloberfläche 28, 81 (1974).Google Scholar
  3. 3.
    H. Puderbach and R. Schoenemann, Metalloberfläche 29, 107 (1975).Google Scholar
  4. 4.
    H. Puderbach, W. Friedemann, and T. Kamino, Metalloberfläche 30, 401 (1976).Google Scholar
  5. 5.
    H. Puderbach and R. Schoenemann, Metalloberfläche 30, 553 (1976).Google Scholar
  6. 6.
    W. Friedemann, H.J. Göhausen, and H. Puderbach, Aluminium 53, 471 (1977).Google Scholar
  7. 7.
    H. Puderbach, H. Gotta, and K. H. Gottwald, Metall 31, 1096 (1977).Google Scholar
  8. 8.
    H.J. Göhausen and H. Puderbach, Metall 33, 250 (1979).Google Scholar
  9. 9.
    H.-G. Germscheid, Tenside-Detergents 19, 3 (1982).Google Scholar
  10. 10.
    A. Benninghoven, D. Jaspers, and W. Sichtermann, Appl. Phys. 11, 35 (1976).CrossRefGoogle Scholar
  11. 11.
    A. Benninghoven, K. H. Müller, M. Schemmer, and P. Beckmann, Proc. 7th Int. Vac. Congr. 2, 1063 (1977).Google Scholar
  12. 12.
    A. Benninghoven and W. Sichtermann, Org. Mass Spectrom. 12, 595 (1977).CrossRefGoogle Scholar
  13. 13.
    A. Benninghoven and W. Sichtermann, Analyt. Chemistry 50, 1180 (1978).CrossRefGoogle Scholar
  14. 14.
    A. Benninghoven, D. Jaspers, and W. Sichtermann, Adv. Mass Spectrom. 7B, 1433 (1978).Google Scholar
  15. 15.
    S. Tanaki, A. Benninghoven, and W. Sichtermann, Springer Ser. Chem. Phys. 9, 127 (1979).CrossRefGoogle Scholar
  16. 16.
    A. Benninghoven, NBS Spec. Publ. 519, 627 (1979).Google Scholar
  17. 17.
    A. Eicke, W. Sichtermann, and A. Benninghoven, Org. Mass Spectrom. 15, 289 (1980).CrossRefGoogle Scholar
  18. 18.
    W. Sichtermann, M. Junack, A. Eicke, and A. Benninghoven, Z. analyt. Chem. 301, 115 (1980).CrossRefGoogle Scholar
  19. 19.
    A. Benninghoven and W. Sichtermann, Int. J. Mass Spectrom. Ion Phys. 38, 351 (1981).CrossRefGoogle Scholar
  20. 20.
    W. Sichtermann and A. Benninghoven, Int. J. Mass Spectrom. Ion Phys. 40, 177 (1981).CrossRefGoogle Scholar
  21. 21.
    A. Benninghoven, SIMS III Proc. 3rd Int. Conf., 438 (1982).Google Scholar

Copyright information

© Springer-Verlag Wien 1983

Authors and Affiliations

  • Herbert Puderbach
    • 1
    • 2
  1. 1.Analytical Laboratories of Henkel KGaADüsseldorfFederal Republic of Germany
  2. 2.ZR-FE Analytik — Phys. MethodenHenkel KGaADüsseldorfFederal Republic of Germany

Personalised recommendations