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Quantitative Surface Analysis Without Reference Samples

  • Maria F. Ebel
  • H. Ebel
  • U. Paschke
  • G. Zuba
  • J. Wernisch
Part of the Mikrochimica Acta book series (MIKROCHIMICA, volume 10)

Abstract

Quantitative analysis without reference samples means that the correlation between measured data and sample composition is described by a theoretical expression. Thus, neither reference samples nor pure element standards have to be employed. For X-ray photoelectron spectroscopy (XPS) and X-ray induced Auger electron spectroscopy (XAS) these theoretical correlations can be given. Besides, a good knowledge of the “fundamental parameters” is necessary.

Keywords

Reference Sample Mass Absorption Coefficient Auger Line Sample Influence Photoelectron Line 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Wien 1983

Authors and Affiliations

  • Maria F. Ebel
    • 1
  • H. Ebel
    • 1
  • U. Paschke
    • 1
  • G. Zuba
    • 1
  • J. Wernisch
    • 1
  1. 1.Institut für Angewandte und Technische PhysikTechnische Universität WienWienAustria

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