Abstract
The dynamic behavior associated with current instabilities in semiconductors is discussed. The important role of electrodynamic interactions is pointed out. In the mean-field approximation, these interactions can be represented by a linear feedback mechanism. Results obtained for two specific cases, the Gunn instability and the Erlbach instability, are reviewed. In these cases, there occurs a soft longitudinal dielectric relaxation mode and an undamping of transverse modes.
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References
Ridley, B. K.: Proc. Phys. Soc. 82, 954 (1964).
Gunn, J. B.: Solid State Comm. 1, 88 (1963);
Gunn, J. B.: IBM J. Res. Develop. 8, 141 (1964).
Erlbach, E.: Phys. Rev. 132, 1976 (1963);
M. Shyam, Kroemer, H.: Appl. Phys. Letters 12, 283 (1968).
Ovshinsky, S. R.: Phys. Rev. Letters 21, 1450 (1968);
for references to other work see H. Fritzsche: IBM J. Res. Develop. 13, 515 (1969).
Pearson, A. D.: IBM J. Res. Develop. 13, 510 (1969); H. J. Stocker (private communication).
Thomas, H.: IEEE Transactions on Magnetics 5, 874 (1969).
Thomas, H.: Lectures presented at the Conference on Fluctuation Phenomena, Chania, Crete, August 1969 (To be published).
Pytte, E. and Thomas, H.: Phys. Rev. 179, 431 (1969).
Pfundtner, K.: Diplomarbeit Frankfurt 1972.
Schlup, W. A.: Phys. kondens. Materie 8, 167 (1968).
Pytte, E.: Phys. kondens. Materie 9, 211 (1969).
Conwell, E. M. and Vassell, M. O.: Phys. Rev. 166, 797 (1968).
Reik, H. G. and Risken, H.: Phys. Rev. 124, 777 (1961).
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© 1973 Springer Fachmedien Wiesbaden
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Thomas, H. (1973). Dynamics of Current Instabilities. In: Haken, H. (eds) Synergetics. Vieweg+Teubner Verlag, Wiesbaden. https://doi.org/10.1007/978-3-663-01511-6_8
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DOI: https://doi.org/10.1007/978-3-663-01511-6_8
Publisher Name: Vieweg+Teubner Verlag, Wiesbaden
Print ISBN: 978-3-519-03011-9
Online ISBN: 978-3-663-01511-6
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