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Magnetic Force Microscopy Characterization of Magnetic Nanowires and Nanotubes

  • Muhammad Ramzan TabasumEmail author
  • Fatih Zighem
  • Luc Piraux
  • Bernard Nysten
Chapter

Abstract

Magnetic force microscopy (MFM) is one of the operational modes of atomic force microscopy (AFM). In this mode, a magnetic probe is brought close to the sample surface and interacts with the magnetic stray fields emanating from the sample. The strength of the local magnetostatic interaction determines the vertical motion of the tip as it scans across the sample. Since early 1990s, it has been widely used in fundamental research on magnetic materials, as well as in the development of magnetic recording components. It has the capacity to map the local stray fields emanating from individual magnetic nanostructures of the sample, hence providing insight into its magnetic behavior.

Keywords

Dipolar Field Magnetic Force Microscopy Stray Field Magnetic Force Microscopy Image Remanent State 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgment

M.R Tabasum is Assistant Professor on leave from department of industrial and manufacturing engineering RCET-UET Lahore. Financial support was provided by the Fédération Wallonie-Bruxelles (ARC 13/18-052 Supracryst) and by the Belgian Federal Science Policy (IAP-PAI 7/05). The authors thank the society it4ip (Louvain-la-Neuve, Belgium) for providing the polycarbonate track-etched membranes.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2017

Authors and Affiliations

  • Muhammad Ramzan Tabasum
    • 1
    Email author
  • Fatih Zighem
    • 2
  • Luc Piraux
    • 1
  • Bernard Nysten
    • 1
  1. 1.Institute of Condensed Matter and Nanosciences, Bio and Soft Matter (IMCN/BSMA)Université catholique de LouvainLouvain La NeuveBelgium
  2. 2.LSPM, CNRS-Université Paris 13Sorbonne Paris CitéVilletaneuseFrance

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