Abstract
The continual increase of the integrated circuit complexity results in the more signal lines close to each other; this may produce the coupling effects among the signal lines. One of main coupling effects is crosstalk effect. In this paper, a new method is presented for the test pattern generation for the multiple victim lines of crosstalk effects; the method makes use of the binary decision diagrams (BDD). First, the BDDs of the circuit under test are built to express the circuit structure and logic values related to crosstalk effects. Second, the test patterns of crosstalk faults are produced by performing the operations on these BDDs and searching for the input assignments of the decision diagrams. The experimental results show that the method proposed in this paper can produce the test patterns of crosstalk effects in shorter time.
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Acknowledgements
This work was supported by Guangdong Provincial Natural Science Foundation of China (No. 2014A030313441), Guangdong Province Science and Technology Project (No. 2013B090600063, No. 2014B090901005), Guangzhou Science and Technology Project (No. 201510010169), and National Natural Science Foundation of China (No. 61072028).
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Pan, Z., Chen, L. (2016). Test Pattern Generation for Multiple Victim Lines of Crosstalk Effect in Digital Circuits by Binary Decision Diagram. In: Qin, Y., Jia, L., Feng, J., An, M., Diao, L. (eds) Proceedings of the 2015 International Conference on Electrical and Information Technologies for Rail Transportation. Lecture Notes in Electrical Engineering, vol 378. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-49370-0_24
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DOI: https://doi.org/10.1007/978-3-662-49370-0_24
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