The Improvement of March C+ Algorithm for Embedded Memory Test

  • Yongwen WangEmail author
  • Qianbing Zheng
  • Yin Yuan
Conference paper
Part of the Communications in Computer and Information Science book series (CCIS, volume 592)


March C+ is commonly used as a memory test algorithm. The basic principle is to use finite state machines to read and write all the addresses one by one. This paper analysis the sensitivity conditions of several fault types not covered by the March C+ algorithm, and derived a new 22 N algorithm, March Y, which increase the fault coverage of WDF, CFdsxwx and CFwd. March Y has the same symmetry as the March C+ algorithm, and achieves the coverage of all of the single unit fault types and coupling faults.


Single unit faults Coupling faults March C+ algorithm March Y algorithm 


  1. 1.
    Arden, W.M.: The international technology roadmap for semiconductors—perspectives and challenges for the next 15 years. Curr. Opin. Solid State Mater. Sci. 6, 371–377 (2002)CrossRefGoogle Scholar
  2. 2.
    Adams, R., Cooley, E.: Analysis of a deceptive destructive read memory fault model and recommended testing. In: Proceedings of IEEE North Atlantic Test Workshop, pp. 27–32 (1996)Google Scholar
  3. 3.
    Dekker, R., Beenker, F., Thijssen, L.: A realistic fault model and test algorithms for static random access memories. IEEE Trans. Comput.-Aided Des. Integr. Circ. Syst. 9, 567–572 (1990)CrossRefGoogle Scholar
  4. 4.
    Marinissen, E.J., Prince, B., Keltel-Schulz, D., Zorian, Y.: Challenges in embedded memory design and test. In: Proceedings of Design, Automation and Test in Europe, pp. 722–727. IEEE (2005)Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2016

Authors and Affiliations

  1. 1.School of ComputerNational University of Defense TechnologyChangshaChina

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