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The Improvement of March C+ Algorithm for Embedded Memory Test

  • Yongwen WangEmail author
  • Qianbing Zheng
  • Yin Yuan
Conference paper
  • 587 Downloads
Part of the Communications in Computer and Information Science book series (CCIS, volume 592)

Abstract

March C+ is commonly used as a memory test algorithm. The basic principle is to use finite state machines to read and write all the addresses one by one. This paper analysis the sensitivity conditions of several fault types not covered by the March C+ algorithm, and derived a new 22 N algorithm, March Y, which increase the fault coverage of WDF, CFdsxwx and CFwd. March Y has the same symmetry as the March C+ algorithm, and achieves the coverage of all of the single unit fault types and coupling faults.

Keywords

Single unit faults Coupling faults March C+ algorithm March Y algorithm 

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Copyright information

© Springer-Verlag Berlin Heidelberg 2016

Authors and Affiliations

  1. 1.School of ComputerNational University of Defense TechnologyChangshaChina

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