Fault Analysis and Diagnosis Method Based on Statistical Learning Theory

  • Wei Zhang


Nowadays, the development of intelligent fault diagnostics has been restricted by two aspects. The first one is the serious deficiency of typical fault data samples and the other one is the difficulty of fault feature discovery.

Copyright information

© Springer-Verlag Berlin Heidelberg and National Defense Industry Press 2016

Authors and Affiliations

  • Wei Zhang
    • 1
  1. 1.Xi’an Research Institute of High-TechXi’anChina

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