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Image Threshold Processing Based on Simulated Annealing and OTSU Method

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Proceedings of the 2015 Chinese Intelligent Systems Conference

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE))

Abstract

This chapter analyzes Maximum between-Cluster Variance method to conduct image threshold, coming up with an optimizing searching method of image segmentation with simulated annealing optimization algorithm. This algorithm determines the optimal threshold adaptively, and has strong adaptability and good effect of image segmentation, and it can greatly reduce the computational complexity. And it is optimized by multi-threading, which improves the parallel algorithm, and speeds up the efficiency of the algorithm.

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Author information

Authors and Affiliations

  1. School of Automation Science and Electrical Engineering, Beihang University, Beijing, 100191, China

    Yue Zhang, Xiaofu Zou, Fei Tao & Lin Zhang

  2. Beijing Aerospace Automatic Control Institute, Beijing, 100854, China

    Hong Yan

Authors
  1. Yue Zhang
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  2. Hong Yan
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  3. Xiaofu Zou
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  4. Fei Tao
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  5. Lin Zhang
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Corresponding author

Correspondence to Yue Zhang .

Editor information

Editors and Affiliations

  1. Beihang University, Beijing, China

    Yingmin Jia

  2. Beijing University of Posts and Telecommunications, Beijing, China

    Junping Du

  3. Tsinghua University, Beijing, China

    Hongbo Li

  4. University of Science & Technology Beijing, Beijing, China

    Weicun Zhang

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© 2016 Springer-Verlag Berlin Heidelberg

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Zhang, Y., Yan, H., Zou, X., Tao, F., Zhang, L. (2016). Image Threshold Processing Based on Simulated Annealing and OTSU Method. In: Jia, Y., Du, J., Li, H., Zhang, W. (eds) Proceedings of the 2015 Chinese Intelligent Systems Conference. Lecture Notes in Electrical Engineering. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-48386-2_24

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  • DOI: https://doi.org/10.1007/978-3-662-48386-2_24

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-48384-8

  • Online ISBN: 978-3-662-48386-2

  • eBook Packages: EngineeringEngineering (R0)

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