Abstract
To detect defects in fabrics more efficiently, easily and accurately, a method based on Local Binary Pattern (LBP) is proposed in this paper. The main purpose of this algorithm is to extract the feature value of fabric images. Firstly the feature of the whole defect-free fabric image is got with LBP algorithm. Then the image is divided into small detection windows, and the feature of each window can be obtained. Compare their similarity calculated by Chi-square function to get the threshold. Then process the defective images according to the same procedure. At last compare the similarity with the threshold to obtain defect regions. The defects are detected at the same time. Experimental results demonstrate that, LBP algorithm is effective in the area of detecting defects of fabrics.
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Li, L.Q., et al.: Image Processing Progress in Fabric Defect Automatic Detection. Donghua University (Natural Science), 李立轻等,图像处理用于织物疵点自动检测的研究进展. 东华大学学报(自然科学版) 28(4), 118–122 (2002)
Cho, C.S., Chung, B.M., Park, M.J.: Development of real-time vision-based fabric inspection system. IEEE Transactions on Industrial Electronics 52(4), 1073–1079 (2005)
Kumar, A.: Computer-Vision-Based fabric defect Detection: A Survey. IEEE Transactions on Industrial Electronics 55(1), 348–363 (2008)
TSai, I.-S., Lin, C.-H., Lin, J.-J.: Applying an Artificial Neural Network to Pattern Recognition in Fabric Defects. Textile Research Journal 65(3), 123–130 (1995)
Manjunath, B.S., Chellappa, R.: Unsupervised texture segmentation using Markov Random Filed Models. IEEE Transactions on Pattern Analysis 13(5), 478–482 (1991)
Guan, S., Shi, X.: Fabric defect detection based on wavelet decomposition with one resolution level. C. In: International Symposium on Information Science and Engineering, Shanghai, pp. 281–285 (2008)
Sari-Sarraf, H., Goddard, J.S.: Vision system for on-loom fabric inspection. IEEE Transactions on Industry Application 35(6), 1252–1259 (1999)
Yang, X.Z., Pang, G.K.H., Yung, N.H.C.: Discriminative fabric defect detection using adaptive wavelet. Optical Engineer 41(12), 3116–3126 (2002)
Zhang, Y., Lu, Z., Li, J.: Fabric defect detection and classification using Gabor filters and Gaussian Mixture Model C. In: Zha, H., Taniguchi, R.-i., Maybank, S. (eds.) ACCV 2009, Part II. LNCS, vol. 5995, pp. 635–644. Springer, Heidelberg (2010)
Tsai, D.-M., Chao, S.-M.: An anisotropic diffusion-based defect detection for sputtered surfaces with inhomogeneous textures. Image and Vision Computing 23(3), 325–338 (2005)
Tsai, D.-M., Kuo, C.-C.: Defect detection in inhomogeneously textured sputtered surfaces using 3D Fourier image reconstruction. Machine Vision and Applications 18(6), 383–400 (2007)
Ojala, T., Pietikainen, M.: Unsupervised Texture Segmentation Using Feature Distributions 32, 477–486 (1999)
Ojala, T.: Multiresolution Gray-Scale and Rotation Invariant Texture Classification with Local Binary Patterns. IEEE Translations on Pattern Analysis and Machine Intelligence 24(7), 971–987 (2002)
Huang, F.: Face Recognition Based on LBP. D. 黄非非. 基于LBP的人脸识别研究. ChongQing University, ChongQing (2009)
Feng, X., Hadid, A.: Facial Expression Recognition with Local Binary Patterns and Linear Programming. Patterns Recognition and Image Analysis 15(2), 546–548 (2005)
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Li, P., Lin, X., Jing, J., Zhang, L. (2014). Defect Detection in Fabrics Using Local Binary Patterns. In: Tan, T., Ruan, Q., Wang, S., Ma, H., Huang, K. (eds) Advances in Image and Graphics Technologies. IGTA 2014. Communications in Computer and Information Science, vol 437. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-45498-5_31
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DOI: https://doi.org/10.1007/978-3-662-45498-5_31
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