Abstract
In order to position the probe tip or the sample, piezoelectric elements are used as actuators. The piezoelectric effect was discovered by the Curie brothers in 1880.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Notes
- 1.
In tables sometimes also the elastic compliance \(S\) is used, which corresponds to the reciprocal of Young’s modulus.
- 2.
In this simplified consideration, we have left out the formation energy of domain walls which results in the formation of larger domains. Larger domains mean less domain wall energy. A further contribution in the energy balance is the build up of mechanical strain inside the domains when an external electric field is applied.
- 3.
If the damping medium is at rest relative to a fixed external coordinate system, (i.e. not oscillating together with \(x_1\), as assumed here), the term \(\dot{x}_1\) has to be neglected in the following. This case applies to a cantilever in atomic force microscopy damped in air.
- 4.
Sometimes a factor of \(1/\sqrt{2}\) is included if the root mean square (RMS) amplitude instead of the peak amplitude is measured.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2015 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Voigtländer, B. (2015). Technical Aspects of Scanning Probe Microscopy. In: Scanning Probe Microscopy. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-45240-0_3
Download citation
DOI: https://doi.org/10.1007/978-3-662-45240-0_3
Published:
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-662-45239-4
Online ISBN: 978-3-662-45240-0
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)