Abstract
In topographic images, the noise in the vertical position of the tip (i.e. the noise in the tip-sample distance) should be considerably smaller than the topography signal on the sample which we want to measure.
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We do not indicate explicitly that the carrier frequency is the shifted resonance frequency \(f'_0\).
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© 2015 Springer-Verlag Berlin Heidelberg
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Voigtländer, B. (2015). Noise in Atomic Force Microscopy. In: Scanning Probe Microscopy. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-45240-0_18
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DOI: https://doi.org/10.1007/978-3-662-45240-0_18
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