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Mapping of Mechanical Properties Using Force-Distance Curves

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Scanning Probe Microscopy

Part of the book series: NanoScience and Technology ((NANO))

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Abstract

The imaging modes considered in the previous chapters resulted mainly in topographic imaging. Contours of constant force in the static mode, or constant frequency shift in the dynamic AM mode, or constant amplitude in the tapping mode are measured. In Chap. 13 we have seen that force-distance curves give important information on the mechanical properties of the sample, like elasticity of the sample, adhesion properties and dissipation. The concept behind mapping of mechanical properties by force-distance curves is to acquire a force-distance curve at each image point and to extract images of elasticity, adhesion and other mechanical properties.

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Correspondence to Bert Voigtländer .

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© 2015 Springer-Verlag Berlin Heidelberg

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Voigtländer, B. (2015). Mapping of Mechanical Properties Using Force-Distance Curves. In: Scanning Probe Microscopy. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-45240-0_16

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