Abstract
The imaging modes considered in the previous chapters resulted mainly in topographic imaging. Contours of constant force in the static mode, or constant frequency shift in the dynamic AM mode, or constant amplitude in the tapping mode are measured. In Chap. 13 we have seen that force-distance curves give important information on the mechanical properties of the sample, like elasticity of the sample, adhesion properties and dissipation. The concept behind mapping of mechanical properties by force-distance curves is to acquire a force-distance curve at each image point and to extract images of elasticity, adhesion and other mechanical properties.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2015 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Voigtländer, B. (2015). Mapping of Mechanical Properties Using Force-Distance Curves. In: Scanning Probe Microscopy. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-45240-0_16
Download citation
DOI: https://doi.org/10.1007/978-3-662-45240-0_16
Published:
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-662-45239-4
Online ISBN: 978-3-662-45240-0
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)