Abstract
Among the large variety of scanning probe microscopy techniques, noncontact atomic force microscopy (NC-AFM) stands out with its capability of atomic-resolution imaging and spectroscopy measurements on conducting, semiconducting as well as insulating sample surfaces. In this chapter, we review the fundamental experimental and instrumental methodology associated with the technique and present key results obtained on different classes of material surfaces. In addition to atomic-resolution imaging, the use of NC-AFM towards the goal of atomic-resolution force spectroscopy is emphasized.
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References
Binnig G, Rohrer H (1982) Scanning tunneling microscopy. Helv Phys Acta 55(6):726–735
Binnig G, Rohrer H, Gerber C, Weibel E (1983) 7x7 Reconstruction on Si(111) resolved in real space. Phys Rev Lett 50(2):120–123
Chen CJ (2007) Introduction to scanning tunneling microscopy. Oxford University Press, Oxford
Bonnell DA, Basov DN, Bode M, Diebold U, Kalinin SV, Madhavan V, Novotny L, Salmeron M, Schwarz UD, Weiss PS (2012) Imaging physical phenomena with local probes: from electrons to photons. Rev Mod Phys 84(3):1343
Binnig G, Quate CF, Gerber C (1986) Atomic force microscope. Phys Rev Lett 56(9):930–933
Albrecht TR, Quate CF (1988) Atomic resolution with the atomic force microscope on conductors and nonconductors. J Vac Sci Technol Vac Surf Films 6(2):271–274
Albrecht TR, Akamine S, Carver TE, Quate CF (1990) Microfabrication of cantilever styli for the atomic force microscope. J Vac Sci Technol-Vac Surf Films 8(4):3386–3396
Akamine S, Barrett RC, Quate CF (1990) Improved atomic force microscope images using microcantilevers with sharp tips. Appl Phys Lett 57(3):316–318
Wolter O, Bayer T, Greschner J (1991) Micromachined silicon sensors for scanning force microscopy. J Vac Sci Technol B 9(2):1353–1357
Meyer G, Amer NM (1988) Novel optical approach to atomic force microscopy. Appl Phys Lett 53(12):1045–1047
Alexander S, Hellemans L, Marti O, Schneir J, Elings V, Hansma PK, Longmire M, Gurley J (1989) An atomic-resolution atomic-force microscope implemented using an optical-lever. J Appl Phys 65(1):164–167
Rugar D, Mamin HJ, Guethner P (1989) Improved fiber-optic interferometer for atomic force microscopy. Appl Phys Lett 55(25):2588–2590
Moser A, Hug HJ, Jung T, Schwarz UD, Guntherodt HJ (1993) A miniature fiber optic force microscope scan head. Meas Sci Technol 4(7):769–775
Binnig G, Gerber C, Stoll E, Albrecht TR, Quate CF (1987) Atomic resolution with atomic force microscope. Europhys Lett 3(12):1281–1286
Meyer G, Amer NM (1990) Optical-beam-deflection atomic force microscopy – the nacl (001) surface. Appl Phys Lett 56(21):2100–2101
Marti O, Colchero J, Mlynek J (1993) Friction and forces on an atomic-scale. Nanosour Manip Atoms Under High Fields Temp Appl 235:253–269
Meyer G, Amer NM (1990) Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope. Appl Phys Lett 57(20):2089–2091
Mate CM, McClelland GM, Erlandsson R, Chiang S (1987) Atomic-scale friction of a tungsten tip on a graphite surface. Phys Rev Lett 59(17):1942–1945
Eaton PJ, West P (2010) Atomic force microscopy. Oxford University Press, Oxford
Giessibl FJ, Binnig G (1992) Investigation of the (001) cleavage plane of potassium-bromide with an atomic force microscope at 4.2-k in ultra-high vacuum. Ultramicroscopy 42:281–289
Ohnesorge F, Binnig G (1993) True atomic-resolution by atomic force microscopy through repulsive and attractive forces. Science 260(5113):1451–1456
Baykara MZ, Schwendemann TC, Altman EI, Schwarz UD (2010) Three-dimensional atomic force microscopy – taking surface imaging to the next level. Adv Mater 22(26–27):2838–2853
Giessibl FJ (1995) Atomic-resolution of the silicon (111)-(7x7) surface by atomic-force microscopy. Science 267(5194):68–71
Sugawara Y, Ohta M, Ueyama H, Morita S (1995) Defect motion on an InP(110) surface observed with noncontact atomic-force microscopy. Science 270(5242):1646–1648
Kitamura S, Iwatsuki M (1995) Observation of 7x7 reconstructed structure on the silicon (111) surface using ultrahigh-vacuum noncontact atomic-force microscopy. Jpn J Appl Phys Part 2 Lett 34(1B):L145–L148
Ueyama H, Ohta M, Sugawara Y, Morita S (1995) Atomically resolved InP(110) surface observed with noncontact ultrahigh-vacuum atomic-force microscope. Jpn J Appl Phys Part 2 Lett 34(8B):L1086–L1088
Morita S, Wiesendanger R, Meyer E (2002) Noncontact atomic force microscopy. Springer, Berlin
Morita S, Giessibl FJ, Wiesendanger R (2009) Noncontact atomic force microscopy, vol 2. Springer, Berlin
Garcia R, Perez R (2002) Dynamic atomic force microscopy methods. Surf Sci Rep 47(6–8):197–301
Giessibl FJ (2003) Advances in atomic force microscopy. Rev Mod Phys 75(3):949–983
Hofer WA, Foster AS, Shluger AL (2003) Theories of scanning probe microscopes at the atomic scale. Rev Mod Phys 75(4):1287–1331
Barth C, Foster AS, Henry CR, Shluger AL (2011) Recent trends in surface characterization and chemistry with high-resolution scanning force methods. Adv Mater 23(4):477–501
Morita S (2013) Atomically resolved force microscopy. J Vac Sci Technol A 31(5):050802
Albrecht TR, Grutter P, Horne D, Rugar D (1991) Frequency-modulation detection using high-q cantilevers for enhanced force microscope sensitivity. J Appl Phys 69(2):668–673
Yokoyama K, Ochi T, Yoshimoto A, Sugawara Y, Morita S (2000) Atomic resolution imaging on Si(100)2x1 and Si(100)2x1: H surfaces with noncontact atomic force microscopy. Japanese J Appl Phys Part 2 Lett 39(2A):L113–L115
Schwarz A, Allers W, Schwarz UD, Wiesendanger R (2000) Dynamic-mode scanning force microscopy study of n-InAs(110)-(1x1) at low temperatures. Phys Rev B 61(4):2837–2845
Kitamura S, Iwatsuki M (1996) Observation of silicon surfaces using ultrahigh-vacuum noncontact, atomic force microscopy. Jpn J Appl Phys Part 2-Lett 35(5B):L668–L671
Sugawara Y, Uchihashi T, Abe M, Morita S (1999) True atomic resolution imaging of surface structure and surface charge on the GaAs(110). Appl Surf Sci 140(3–4):371–375
Sawada D, Sugimoto Y, Morita K, Abe M, Morita S (2010) Simultaneous atomic force and scanning tunneling microscopy study of the Ge(111)-c(2x8) surface. J Vac Sci Technol B 28(3):C4D1
Yokoyama K, Ochi T, Sugawara Y, Morita S (1999) Atomically resolved silver imaging on the Si(111)-(root 3 x root 3)-Ag surface using a noncontact atomic force microscope. Phys Rev Lett 83(24):5023–5026
Sweetman A, Gangopadhyay S, Danza R, Berdunov N, Moriarty P (2009) qPlus atomic force microscopy of the Si(100) surface: buckled, split-off, and added dimers. Appl Phys Lett 95(6):063112
Sweetman A, Danza R, Gangopadhyay S, Moriarty P (2012) Imaging and manipulation of the Si(100) surface by small-amplitude NC-AFM at zero and very low applied bias. J Phys Condens Matter 24(8):084009
Sweetman A, Stannard A, Sugimoto Y, Abe M, Morita S, Moriarty P (2013) Simultaneous noncontact AFM and STM of Ag:Si(111)-(root 3 x root 3)R30°. Phys Rev B 87(7):075310
Li YJ, Nomura H, Ozaki N, Naitoh Y, Kageshima M, Sugawara Y, Hobbs C, Kantorovich L (2006) Origin of p(2 x 1) phase on Si(001) by noncontact atomic force microscopy at 5 k. Phys Rev Lett 96(10):106104
Naitoh Y, Ma ZM, Li YJ, Kageshima M, Sugawara Y (2010) Simultaneous observation of surface topography and elasticity at atomic scale by multifrequency frequency modulation atomic force microscopy. J Vac Sci Technol B 28(6):1210–1214
Minobe T, Uchihashi T, Tsukamoto T, Orisaka S, Sugawara Y, Morita S (1999) Distance dependence of noncontact-AFM image contrast on Si(111)root 3 X root 3-Ag structure. Appl Surf Sci 140(3–4):298–303
Orisaka S, Minobe T, Uchihashi T, Sugawara Y, Morita S (1999) The atomic resolution imaging of metallic Ag(111) surface by noncontact atomic force microscope. Appl Surf Sci 140(3–4):243–246
Loppacher C, Bammerlin M, Guggisberg M, Schar S, Bennewitz R, Baratoff A, Meyer E, Guntherodt HJ (2000) Dynamic force microscopy of copper surfaces: atomic resolution and distance dependence of tip-sample interaction and tunneling current. Phys Rev B 62(24):16944–16949
Caciuc V, Holscher H, Weiner D, Fuchs H, Schirmeisen A (2008) Noncontact atomic force microscopy imaging mechanism on Ag(110): experiment and first-principles theory. Phys Rev B 77(4):045411
Konig T, Simon GH, Rust HP, Heyde M (2009) Atomic resolution on a metal single crystal with dynamic force microscopy. Appl Phys Lett 95(8):083116
Allers W, Schwarz A, Schwarz UD, Wiesendanger R (1999) Dynamic scanning force microscopy at low temperatures on a noble-gas crystal: atomic resolution on the xenon(111) surface. Europhys Lett 48(3):276–279
Barth C, Reichling M (2001) Imaging the atomic arrangements on the high-temperature reconstructed alpha-Al2O3(0001) surface. Nature 414(6859):54–57
Reichling M, Barth C (1999) Scanning force imaging of atomic size defects on the CaF2(111) surface. Phys Rev Lett 83(4):768–771
Barth C, Foster AS, Reichling M, Shluger AL (2001) Contrast formation in atomic resolution scanning force microscopy on CaF(2)(111): experiment and theory. J Phys-Condens Matter 13(10):2061–2079
Hoffmann R, Lantz MA, Hug HJ, van Schendel PJA, Kappenberger P, Martin S, Baratoff A, Guntherodt HJ (2003) Atomic resolution imaging and frequency versus distance measurements on NiO(001) using low-temperature scanning force microscopy. Phys Rev B 67(8):085402
Ruschmeier K, Schirmeisen A, Hoffmann R (2009) Site-specific force-vector field studies of KBr(001) by atomic force microscopy. Nanotechnology 20(26):264013
Gritschneder S, Namai Y, Iwasawa Y, Reichling M (2005) Structural features of CeO2(111) revealed by dynamic SFM. Nanotechnology 16(3):S41–S48
Ostendorf F, Torbrugge S, Reichling M (2008) Atomic scale evidence for faceting stabilization of a polar oxide surface. Phys Rev B 77(4):041405
Rasmussen MK, Foster AS, Canova FF, Hinnemann B, Helveg S, Meinander K, Besenbacher F, Lauritsen JV (2011) Noncontact atomic force microscopy imaging of atomic structure and cation defects of the polar MgAl2O4(100) surface: experiments and first-principles simulations. Phys Rev B 84(23):235419
Hoffmann R, Weiner D, Schirmeisen A, Foster AS (2009) Sublattice identification in noncontact atomic force microscopy of the NaCl(001) surface. Phys Rev B 80(11):115426
Gross L, Mohn F, Moll N, Liljeroth P, Meyer G (2009) The chemical structure of a molecule resolved by atomic force microscopy. Science 325(5944):1110–1114
Gross L, Mohn F, Moll N, Meyer G, Ebel R, Abdel-Mageed WM, Jaspars M (2010) Organic structure determination using atomic-resolution scanning probe microscopy. Nat Chem 2(10):821–825
Meyer G, Gross L, Mahn F, Repp J (2012) Scanning probe microscopy of atoms and molecules on insulating films: from imaging to molecular manipulation. Chimia 66(1–2):10–15
Mohn F, Schuler B, Gross L, Meyer G (2013) Different tips for high-resolution atomic force microscopy and scanning tunneling microscopy of single molecules. Appl Phys Lett 102(7):073109
Gotsmann B, Anczykowski B, Seidel C, Fuchs H (1999) Determination of tip-sample interaction forces from measured dynamic force spectroscopy curves. Appl Surf Sci 140(3–4):314–319
Durig U (1999) Relations between interaction force and frequency shift in large-amplitude dynamic force microscopy. Appl Phys Lett 75(3):433–435
Giessibl FJ (2001) A direct method to calculate tip-sample forces from frequency shifts in frequency-modulation atomic force microscopy. Appl Phys Lett 78(1):123–125
Sader JE, Jarvis SP (2004) Accurate formulas for interaction force and energy in frequency modulation force spectroscopy. Appl Phys Lett 84(10):1801–1803
Giessibl FJ (1997) Forces and frequency shifts in atomic-resolution dynamic-force microscopy. Phys Rev B 56(24):16010–16015
Durig U (2000) Extracting interaction forces and complementary observables in dynamic probe microscopy. Appl Phys Lett 76(9):1203–1205
Holscher H, Schwarz A, Allers W, Schwarz UD, Wiesendanger R (2000) Quantitative analysis of dynamic-force-spectroscopy data on graphite(0001) in the contact and noncontact regimes. Phys Rev B 61(19):12678–12681
Gotsmann B, Fuchs H (2001) Dynamic force spectroscopy of conservative and dissipative forces in an Al-Au(111) tip-sample system. Phys Rev Lett 86(12):2597–2600
Lantz MA, Hug HJ, Hoffmann R, van Schendel PJA, Kappenberger P, Martin S, Baratoff A, Guntherodt HJ (2001) Quantitative measurement of short-range chemical bonding forces. Science 291(5513):2580–2583
Hoffmann R, Kantorovich LN, Baratoff A, Hug HJ, Guntherodt HJ (2004) Sublattice identification in scanning force microscopy on alkali halide surfaces. Phys Rev Lett 92(14):146103
Abe M, Sugimoto Y, Custance O, Morita S (2005) Room-temperature reproducible spatial force spectroscopy using atom-tracking technique. Appl Phys Lett 87(17):173503
Sugimoto Y, Innami S, Abe M, Custance O, Morita S (2007) Dynamic force spectroscopy using cantilever higher flexural modes. Appl Phys Lett 91(9):093120
Sugimoto Y, Pou P, Abe M, Jelinek P, Perez R, Morita S, Custance O (2007) Chemical identification of individual surface atoms by atomic force microscopy. Nature 446(7131):64–67
Langkat SM, Holscher H, Schwarz A, Wiesendanger R (2003) Determination of site specific interatomic forces between an iron coated tip and the NiO(001) surface by force field spectroscopy. Surf Sci 527(1–3):12–20
Schirmeisen A, Weiner D, Fuchs H (2006) Single-atom contact mechanics: from atomic scale energy barrier to mechanical relaxation hysteresis. Phys Rev Lett 97(13):136101
Heyde M, Simon GH, Rust HP, Freund HJ (2006) Probing adsorption sites on thin oxide films by dynamic force microscopy. Appl Phys Lett 89(26):263107
Ruschmeier K, Schirmeisen A, Hoffmann R (2008) Atomic-scale force-vector fields. Phys Rev Lett 101(15):156102
Sugimoto Y, Namikawa T, Miki K, Abe M, Morita S (2008) Vertical and lateral force mapping on the Si(111)-(7x7) surface by dynamic force microscopy. Phys Rev B 77(19):195424
Ashino M, Obergfell D, Haluska M, Yang SH, Khlobystov AN, Roth S, Wiesendanger R (2008) Atomically resolved mechanical response of individual metallofullerene molecules confined inside carbon nanotubes. Nat Nanotechnol 3(6):337–341
Albers BJ, Schwendemann TC, Baykara MZ, Pilet N, Liebmann M, Altman EI, Schwarz UD (2009) Three-dimensional imaging of short-range chemical forces with picometre resolution. Nat Nanotechnol 4(5):307–310
Baykara MZ, Schwendemann TC, Albers BJ, Pilet N, Monig H, Altman EI, Schwarz UD (2012) Exploring atomic-scale lateral forces in the attractive regime: a case study on graphite (0001). Nanotechnology 23(40):405703
Baykara MZ, Todorovic M, Monig H, Schwendemann TC, Unverdi O, Rodrigo L, Altman EI, Perez R, Schwarz UD (2013) Atom-specific forces and defect identification on surface-oxidized Cu(100) with combined 3D-AFM and STM measurements. Phys Rev B 87(15):155414
Fremy S, Kawai S, Pawlak R, Glatzel T, Baratoff A, Meyer E (2012) Three-dimensional dynamic force spectroscopy measurements on KBr(001): atomic deformations at small tip-sample separations. Nanotechnology 23(5):055401
Baykara MZ, Dagdeviren OE, Schwendemann TC, Monig H, Altman EI, Schwarz UD (2012) Probing three-dimensional surface force fields with atomic resolution: measurement strategies, limitations, and artifact reduction. Beilstein J Nanotechnol 3:637–650
Pethica JB (1986) Interatomic forces in scanning tunneling microscopy – giant corrugations of the graphite surface – comment. Phys Rev Lett 57(25):3235
Martin Y, Williams CC, Wickramasinghe HK (1987) Atomic force microscope force mapping and profiling on a sub 100-a scale. J Appl Phys 61(10):4723–4729
Zhong Q, Inniss D, Kjoller K, Elings VB (1993) Fractured polymer silica fiber surface studied by tapping mode atomic-force microscopy. Surf Sci 290(1–2):L688–L692
Castro García R (2010) Amplitude modulation atomic force microscopy. Wiley-VCH, Weinheim
Erlandsson R, Olsson L, Martensson P (1996) Inequivalent atoms and imaging mechanisms in ac-mode atomic-force microscopy of Si(111)7x7. Phys Rev B 54(12):R8309–R8312
Israelachvili JN (2011) Intermolecular and surface forces. Academic, Burlington
Moll N, Gross L, Mohn F, Curioni A, Meyer G (2010) The mechanisms underlying the enhanced resolution of atomic force microscopy with functionalized tips. New J Phys 12(12):125020
Fukui K, Onishi H, Iwasawa Y (1997) Atom-resolved image of the TiO2(110) surface by noncontact atomic force microscopy. Phys Rev Lett 79(21):4202–4205
Allers W, Schwarz A, Schwarz UD, Wiesendanger R (1999) Dynamic scanning force microscopy at low temperatures on a van der Waals surface: graphite (0001). Appl Surf Sci 140(3–4):247–252
Giessibl FJ (2000) Atomic resolution on Si(111)-(7x7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork. Appl Phys Lett 76(11):1470–1472
Giessibl FJ, Hembacher S, Bielefeldt H, Mannhart J (2000) Subatomic features on the silicon (111)-(7x7) surface observed by atomic force microscopy. Science 289(5478):422–425
Giessibl FJ, Hembacher S, Herz M, Schiller C, Mannhart J (2004) Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor. Nanotechnology 15(2):S79–S86
Albers BJ, Liebmann M, Schwendemann TC, Baykara MZ, Heyde M, Salmeron M, Altman EI, Schwarz UD (2008) Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy. Rev Sci Instrum 79(3):033704
Giessibl FJ, Bielefeldt H, Hembacher S, Mannhart J (1999) Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy. Appl Surf Sci 140(3–4):352–357
Perez R, Payne MC, Stich I, Terakura K (1997) Role of covalent tip-surface interactions in noncontact atomic force microscopy on reactive surfaces. Phys Rev Lett 78(4):678–681
Perez R, Stich I, Payne MC, Terakura K (1998) Surface-tip interactions in noncontact atomic-force microscopy on reactive surfaces: Si(111). Phys Rev B 58(16):10835–10849
Bennewitz R, Bammerlin M, Guggisberg M, Loppacher C, Baratoff A, Meyer E, Guntherodt HJ (1999) Aspects of dynamic force microscopy on NaCl/Cu(111): resolution, tip-sample interactions and cantilever oscillation characteristics. Surf Interface Anal 27(5–6):462–466
Guggisberg M, Bammerlin M, Loppacher C, Pfeiffer O, Abdurixit A, Barwich V, Bennewitz R, Baratoff A, Meyer E, Guntherodt HJ (2000) Separation of interactions by noncontact force microscopy. Phys Rev B 61(16):11151–11155
Kawai S, Glatzel T, Koch S, Baratoff A, Meyer E (2011) Interaction-induced atomic displacements revealed by drift-corrected dynamic force spectroscopy. Phys Rev B 83(3):035421
Sugimoto Y, Ueda K, Abe M, Morita S (2012) Three-dimensional scanning force/tunneling spectroscopy at room temperature. J Phys Condens Matter 24(8):084008
Braun DA, Weiner D, Such B, Fuchs H, Schirmeisen A (2009) Submolecular features of epitaxially grown PTCDA on Cu(111) analyzed by force field spectroscopy. Nanotechnology 20(26):264004
Mohn F, Gross L, Meyer G (2011) Measuring the short-range force field above a single molecule with atomic resolution. Appl Phys Lett 99(5):053106
Such B, Glatzel T, Kawai S, Koch S, Meyer E (2010) Three-dimensional force spectroscopy of KBr(001) by tuning fork-based cryogenic noncontact atomic force microscopy. J Vac Sci Technol B 28(3):C4B1
Such B, Glatzel T, Kawai S, Meyer E, Turansky R, Brndiar J, Stich I (2012) Interplay of the tip-sample junction stability and image contrast reversal on a Cu(111) surface revealed by the 3D force field. Nanotechnology 23(4):045705
Abe M, Sugimoto Y, Custance O, Morita S (2005) Atom tracking for reproducible force spectroscopy at room temperature with non-contact atomic force microscopy. Nanotechnology 16(12):3029–3034
Abe M, Sugimoto Y, Namikawa T, Morita K, Oyabu N, Morita S (2007) Drift-compensated data acquisition performed at room temperature with frequency modulation atomic force microscopy. Appl Phys Lett 90(20):203103
Enevoldsen GH, Pinto HP, Foster AS, Jensen MCR, Kuhnle A, Reichling M, Hofer WA, Lauritsen JV, Besenbacher F (2008) Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO(2)(110) surface. Phys Rev B 78(4):045416
Oyabu N, Pou P, Sugimoto Y, Jelinek P, Abe M, Morita S, Perez R, Custance O (2006) Single atomic contact adhesion and dissipation in dynamic force microscopy. Phys Rev Lett 96(10):106101
Pou P, Ghasemi SA, Jelinek P, Lenosky T, Goedecker S, Perez R (2009) Structure and stability of semiconductor tip apexes for atomic force microscopy. Nanotechnology 20(26):264015
Bechstein R, Gonzalez C, Schutte J, Jelinek P, Perez R, Kuhnle A (2009) ‘All-inclusive’ imaging of the rutile TiO2(110) surface using NC-AFM. Nanotechnology 20(50):505703
Arai T, Gritschneder S, Troger L, Reichling M (2010) Atomic resolution force microscopy imaging on a strongly ionic surface with differently functionalized tips. J Vac Sci Technol B 28(6):1279–1283
Lauritsen JV, Foster AS, Olesen GH, Christensen MC, Kuhnle A, Helveg S, Rostrup-Nielsen JR, Clausen BS, Reichling M, Besenbacher F (2006) Chemical identification of point defects and adsorbates on a metal oxide surface by atomic force microscopy. Nanotechnology 17(14):3436–3441
Enevoldsen GH, Foster AS, Christensen MC, Lauritsen JV, Besenbacher F (2007) Noncontact atomic force microscopy studies of vacancies and hydroxyls of TiO(2)(110): experiments and atomistic simulations. Phys Rev B 76(20):205415
Uluutku B, Baykara MZ (2013) Effect of lateral tip stiffness on atomic-resolution force field spectroscopy. J Vac Sci Technol B 31(4):041801
Sun ZX, Boneschanscher MP, Swart I, Vanmaekelbergh D, Liljeroth P (2011) Quantitative atomic force microscopy with carbon monoxide terminated tips. Phys Rev Lett 106(4):046104
Schwarz A, Schwarz UD, Langkat S, Holscher H, Allers W, Wiesendanger R (2002) Dynamic force microscopy with atomic resolution at low temperatures. Appl Surf Sci 188(3–4):245–251
Rahe P, Schutte J, Schniederberend W, Reichling M, Abe M, Sugimoto Y, Kuhnle A (2011) Flexible drift-compensation system for precise 3D force mapping in severe drift environments. Rev Sci Instrum 82(6):063704
Fukuma T, Ichii T, Kobayashi K, Yamada H, Matsushige K (2005) True-molecular resolution imaging by frequency modulation atomic force microscopy in various environments. Appl Phys Lett 86(3):034103
Fukuma T, Kobayashi K, Matsushige K, Yamada H (2005) True atomic resolution in liquid by frequency-modulation atomic force microscopy. Appl Phys Lett 87(3):034101
Fukuma T, Ueda Y, Yoshioka S, Asakawa H (2010) Atomic-scale distribution of water molecules at the mica-water interface visualized by three-dimensional scanning force microscopy. Phys Rev Lett 104(1):016101
Herruzo ET, Asakawa H, Fukuma T, Garcia R (2013) Three-dimensional quantitative force maps in liquid with 10 piconewton, angstrom and sub-minute resolutions. Nanoscale 5(7):2678–2685
Asakawa H, Fukuma T (2009) Spurious-free cantilever excitation in liquid by piezoactuator with flexure drive mechanism. Rev Sci Instrum 80(10):103703
Asakawa H, Fukuma T (2009) The molecular-scale arrangement and mechanical strength of phospholipid/cholesterol mixed bilayers investigated by frequency modulation atomic force microscopy in liquid. Nanotechnology 20(26):264008
Mitani Y, Kubo M, Muramoto K, Fukuma T (2009) Wideband digital frequency detector with subtraction-based phase comparator for frequency modulation atomic force microscopy. Rev Sci Instrum 80(8):083705
Fukuma T (2009) Wideband low-noise optical beam deflection sensor with photothermal excitation for liquid-environment atomic force microscopy. Rev Sci Instrum 80(2):023707
Guthner P (1996) Simultaneous imaging of Si(111) 7x7 with atomic resolution in scanning tunneling microscopy, atomic force microscopy, and atomic force microscopy noncontact mode. J Vac Sci Technol B 14(4):2428–2431
Luthi R, Meyer E, Bammerlin M, Baratoff A, Lehmann T, Howald L, Gerber C, Guntherodt HJ (1996) Atomic resolution in dynamic force microscopy across steps on Si(111)7x7. Z Physik B-Condens Matter 100(2):165–167
Nakagiri N, Suzuki M, Okiguchi K, Sugimura H (1997) Site discrimination of adatoms in Si(111)-7x7 by noncontact atomic force microscopy. Surf Sci 373(1):L329–L332
Sawada D, Sugimoto Y, Abe M, Morita S (2010) Observation of subsurface atoms of the si(111)-(7x7) surface by atomic force microscopy. Appl Phys Express 3(11):116602
Sugimoto Y, Nakajima Y, Sawada D, Morita K, Abe M, Morita S (2010) Simultaneous AFM and STM measurements on the Si(111)-(7x7) surface. Phys Rev B 81(24):245322
Uozumi T, Tomiyoshi Y, Suehira N, Sugawara Y, Morita S (2002) Observation of Si(100) surface with noncontact atomic force microscope at 5 K. Appl Surf Sci 188(3–4):279–284
Sweetman A, Jarvis S, Danza R, Bamidele J, Gangopadhyay S, Shaw GA, Kantorovich L, Moriarty P (2011) Toggling bistable atoms via mechanical switching of bond angle. Phys Rev Lett 106(13):136101
Sweetman A, Jarvis S, Danza R, Bamidele J, Kantorovich L, Moriarty P (2011) Manipulating Si(100) at 5 K using qPlus frequency modulated atomic force microscopy: role of defects and dynamics in the mechanical switching of atoms. Phys Rev B 84(8):085426
Sweetman A, Jarvis S, Danza R, Moriarty P (2012) Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: probing the probe. Beilstein J Nanotechnol 3:25–32
Naitoh Y, Li YJ, Nomura H, Kageshima M, Sugawara Y (2010) Effect of surface stress around the sa step of Si(001) on the dimer structure determined by noncontact atomic force microscopy at 5 K. J Physical Soc Japan 79(1):013601
Sugimoto Y, Abe M, Yoshimoto K, Custance O, Yi I, Morita S (2005) Non-contact atomic force microscopy study of the Sn/Si(111) mosaic phase. Appl Surf Sci 241(1–2):23–27
Yi I, Sugimoto Y, Nishi R, Morita S (2006) Study on topographic images of Sn/Si(111)-(root 3 x root 3)R30° surface by non-contact AFM. Surf Sci 600(17):3382–3387
Yi I, Nishi R, Sugimoto Y, Morita S (2007) Non-contact AFM observation of the (root 3x root 3) to (3x3) phase transition on Sn/Ge(111) and Sn/Si(111) surfaces. Appl Surf Sci 253(6):3072–3076
Sugimoto Y, Pou P, Custance O, Jelinek P, Morita S, Perez R, Abe M (2006) Real topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy: the case of the alpha-Sn/Si(111)-(root 3x root 3)R30° surface. Phys Rev B 73(20):205329
Abe M, Sugimoto Y, Morita S (2005) Imaging the restatom of the Ge(111)-c(2x8) surface with noncontact atomic force microscopy at room temperature. Nanotechnology 16(3):S68–S72
Schwarz A, Allers W, Schwarz UD, Wiesendanger R (2000) Detection of doping atom distributions and individual dopants in InAs(110) by dynamic-mode scanning force microscopy in ultrahigh vacuum. Phys Rev B 62(20):13617–13622
Henrich VE, Cox PA (1994) The surface science of metal oxides. Cambridge University Press, Cambridge
Diebold U (2003) The surface science of titanium dioxide. Surf Sci Rep 48(5–8):53–229
Freund HJ, Pacchioni G (2008) Oxide ultra-thin films on metals: new materials for the design of supported metal catalysts. Chem Soc Rev 37(10):2224–2242
Raza H, Pang CL, Haycock SA, Thornton G (1999) Non-contact atomic force microscopy imaging of TiO2(100) surfaces. Appl Surf Sci 140(3–4):271–275
Enevoldsen GH, Pinto HP, Foster AS, Jensen MCR, Hofer WA, Hammer B, Lauritsen JV, Besenbacher F (2009) Imaging of the hydrogen subsurface site in rutile TiO(2). Phys Rev Lett 102(13):136103
Yurtsever A, Sugimoto Y, Abe M, Morita S (2010) NC-AFM imaging of the TiO(2)(110)-(1x1) surface at low temperature. Nanotechnology 21(16):165702
Yurtsever A, Fernandez-Torre D, Gonzalez C, Jelinek P, Pou P, Sugimoto Y, Abe M, Perez R, Morita S (2012) Understanding image contrast formation in TiO2 with force spectroscopy. Phys Rev B 85(12):125416
Pang CL, Raza H, Haycock SA, Thornton G (2002) Noncontact atomic force microscopy imaging of ultrathin Al2O3 on NiAl(110). Phys Rev B 65(20):201401
Wang J, Howard A, Egdell RG, Pethica JB, Foord JS (2002) Arrangement of rotational domains of the (root 31 x root 31) R +/− 9° reconstruction of Al2O3(0001) revealed by non-contact AFM. Surf Sci 515(2–3):337–343
Simon GH, Konig T, Nilius M, Rust HP, Heyde M, Freund HJ (2008) Atomically resolved force microscopy images of complex surface unit cells: ultrathin alumina film on NiAl(110). Phys Rev B 78(11):113401
Simon GH, Konig T, Rust HP, Heyde M, Freund HJ (2009) Atomic structure of the ultrathin alumina on NiAl(110) and its antiphase domain boundaries as seen by frequency modulation dynamic force microscopy. New J Phys 11(9):093009
Lauritsen JV, Jensen MCR, Venkataramani K, Hinnemann B, Helveg S, Clausen BS, Besenbacher F (2009) Atomic-scale structure and stability of the root 31 x root 31R9° surface of Al2O3(0001). Phys Rev Lett 103(7):076103
Heyde M, Simon GH, Lichtenstein L (2013) Resolving oxide surfaces – from point and line defects to complex network structures. Phys Status Solidi B-Basic Solid State Phys 250(5):895–921
Simon GH, Konig T, Heinke L, Lichtenstein L, Heyde M, Freund HJ (2011) Atomic structure of surface defects in alumina studied by dynamic force microscopy: strain-relief-, translation- and reflection-related boundaries, including their junctions. New J Phys 13(12):123028
Fukui K, Namai Y, Iwasawa Y (2002) Imaging of surface oxygen atoms and their defect structures on CeO2(111) by noncontact atomic force microscopy. Appl Surf Sci 188(3–4):252–256
Namai Y, Fukui KI, Iwasawa Y (2003) Atom-resolved noncontact atomic force microscopic and scanning tunneling microscopic observations of the structure and dynamic behavior of CeO2(111) surfaces. Catal Today 85(2–4):79–91
Namai Y, Fukui K, Iwasawa Y (2003) Atom-resolved noncontact atomic force microscopic observations of CeO2(111) surfaces with different oxidation states: surface structure and behavior of surface oxygen atoms. J Phys Chem B 107(42):11666–11673
Gritschneder S, Reichling M (2007) Structural elements of CeO2(111) surfaces. Nanotechnology 18(4):044024
Gritschneder S, Reichling M (2008) Atomic resolution imaging on CeO2(111) with hydroxylated probes. J Phys Chem C 112(6):2045–2049
Pieper HH, Derks C, Zoellner MH, Olbrich R, Troger L, Schroeder T, Neumann M, Reichling M (2012) Morphology and nanostructure of CeO2(111) surfaces of single crystals and Si(111) supported ceria films. Phys Chem Chem Phys 14(44):15361–15368
Hosoi H, Sueoka K, Hayakawa K, Mukasa K (2000) Atomic resolved imaging of cleaved NiO(100) surfaces by NC-AFM. Appl Surf Sci 157(4):218–221
Allers W, Langkat S, Wiesendanger R (2001) Dynamic low-temperature scanning force microscopy on nickel oxide (001). Appl Phys Mater Sci Process 72:S27–S30
Kaiser U, Schwarz A, Wiesendanger R (2007) Magnetic exchange force microscopy with atomic resolution. Nature 446(7135):522–525
Schmid M, Mannhart J, Giessibl FJ (2008) Searching atomic spin contrast on nickel oxide (001) by force microscopy. Phys Rev B 77(4):045402
Kaiser U, Schwarz A, Wiesendanger R (2008) Evaluating local properties of magnetic tips utilizing an antiferromagnetic surface. Phys Rev B 78(10):104418
Barth C, Henry CR (2003) Atomic resolution imaging of the (001) surface of UHV cleaved MgO by dynamic scanning force microscopy. Phys Rev Lett 91(19):196102
Heyde M, Sterrer M, Rust HP, Freund HJ (2005) Atomic resolution on MgO(001) by atomic force microscopy using a double quartz tuning fork sensor at low-temperature and ultrahigh vacuum. Appl Phys Lett 87(8):083104
Heyde M, Sterrer M, Rust HP, Freund HJ (2006) Frequency modulated atomic force microscopy on MgO(001) thin films: interpretation of atomic image resolution and distance dependence of tip-sample interaction. Nanotechnology 17(7):S101–S106
Torbrugge S, Ostendorf F, Reichling M (2009) Stabilization of zinc-terminated ZnO(0001) by a modified surface stoichiometry. J Phys Chem C 113(12):4909–4914
Suzuki S, Ohminami Y, Tsutsumi T, Shoaib MM, Ichikawa M, Asakura K (2003) The first observation of an atomic scale noncontact AFM image of MoO3(010). Chem Lett 32(12):1098–1099
Rasmussen MK, Foster AS, Hinnemann B, Canova FF, Helveg S, Meinander K, Martin NM, Knudsen J, Vlad A, Lundgren E, Stierle A, Besenbacher F, Lauritsen JV (2011) Stable cation inversion at the MgAl2O4(100) surface. Phys Rev Lett 107(3):036102
Rasmussen MK, Meinander K, Besenbacher F, Lauritsen JV (2012) Noncontact atomic force microscopy study of the spinel MgAl2O4(111) surface. Beilstein J Nanotechnol 3:192–197
Kishimoto S, Kageshima M, Naitoh Y, Li YJ, Sugawara Y (2008) Study of oxidized Cu(110) surface using noncontact atomic force microscopy. Surf Sci 602(13):2175–2182
Lauritsen JV, Reichling M (2010) Atomic resolution non-contact atomic force microscopy of clean metal oxide surfaces. J Phys Condens Matter 22(26):263001
Irie H, Sunada K, Hashimoto K (2004) Recent developments in TiO2 photocatalysis: novel applications to interior ecology materials and energy saving systems. Electrochemistry 72(12):807–812
Onishi H, Iwasawa Y (1994) Reconstruction of TiO2(110) surface – STM study with atomic-scale resolution. Surf Sci 313(1–2):L783–L789
Wendt S, Matthiesen J, Schaub R, Vestergaard EK, Laegsgaard E, Besenbacher F, Hammer B (2006) Formation and splitting of paired hydroxyl groups on reduced TiO2(110). Phys Rev Lett 96(6):066107
Schaub R, Thostrup P, Lopez N, Laegsgaard E, Stensgaard I, Norskov JK, Besenbacher F (2001) Oxygen vacancies as active sites for water dissociation on rutile TiO(2)(110). Phys Rev Lett 87(26):266104
Wendt S, Schaub R, Matthiesen J, Vestergaard EK, Wahlstrom E, Rasmussen MD, Thostrup P, Molina LM, Laegsgaard E, Stensgaard I, Hammer B, Besenbacher F (2005) Oxygen vacancies on TiO2(110) and their interaction with H2O and O-2: a combined high-resolution STM and DFT study. Surf Sci 598(1–3):226–245
Foster AS, Pakarinen OH, Airaksinen JM, Gale JD, Nieminen RM (2003) Simulating atomic force microscopy imaging of the ideal and defected TiO2(110) surface. Phys Rev B 68(19):195410
Pinto HP, Enevoldsen GH, Besenbacher F, Lauritsen JV, Foster AS (2009) The role of tip size and orientation, tip-surface relaxations and surface impurities in simultaneous AFM and STM studies on the TiO(2)(110) surface. Nanotechnology 20(26):264020
Bammerlin M, Lüthi R, Meyer E, Baratoff A, Lü J, Guggisberg M, Gerber C, Howald L, Güntherodt HJ (1997) True atomic resolution on the surface of an insulator via ultrahigh vacuum dynamic force microscopy. Probe Microsc 1:3
Foster AS, Barth C, Shluger AL, Reichling M (2001) Unambiguous interpretation of atomically resolved force microscopy images of an insulator. Phys Rev Lett 86(11):2373–2376
Foster AS, Barth C, Shluger AL, Nieminen RM, Reichling M (2002) Role of tip structure and surface relaxation in atomic resolution dynamic force microscopy: CaF2(111) as a reference surface. Phys Rev B 66(23):235417
Barth C, Reichling M (2000) Resolving ions and vacancies at step edges on insulating surfaces. Surf Sci 470(1–2):L99–L103
Bennewitz R, Schar S, Barwich V, Pfeiffer O, Meyer E, Krok F, Such B, Kolodzej J, Szymonski M (2001) Atomic-resolution images of radiation damage in KBr. Surf Sci 474(1–3):L197–L202
Bennewitz R, Pfeiffer O, Schar S, Barwich V, Meyer E, Kantorovich LN (2002) Atomic corrugation in nc-AFM of alkali halides. Appl Surf Sci 188(3–4):232–237
Fujii S, Fujihira M (2007) Atomic contrast on a point defect on CaF2(111) imaged by non-contact atomic force microscopy. Nanotechnology 18(8):084011
Giessibl FJ, Reichling M (2005) Investigating atomic details of the CaF2(111) surface with a qPlus sensor. Nanotechnology 16(3):S118–S124
Hirth S, Ostendorf F, Reichling M (2006) Lateral manipulation of atomic size defects on the CaF2(111) surface. Nanotechnology 17(7):S148–S154
Hoffmann R, Lantz MA, Hug HJ, van Schendel PJA, Kappenberger P, Martin S, Baratoff A, Guntherodt HJ (2002) Atomic resolution imaging and force versus distance measurements on KBr(001) using low temperature scanning force microscopy. Appl Surf Sci 188(3–4):238–244
Bammerlin M, Luthi R, Meyer E, Baratoff A, Lu J, Guggisberg M, Loppacher C, Gerber C, Guntherodt HJ (1998) Dynamic SFM with true atomic resolution on alkali halide surfaces. Appl Phys Mater Sci Process 66:S293–S294
Barth C, Henry CR (2008) Imaging Suzuki precipitates on NaCl: Mg(2+)(001) by scanning force microscopy. Phys Rev Lett 100(9):096101
Barth C, Henry CR (2009) NaCl(001) surfaces nanostructured by Suzuki precipitates: a scanning force microscopy study. New J Phys 11(4):043003
Foster AS, Barth C, Henry CR (2009) Chemical identification of ions in doped NaCl by scanning force microscopy. Phys Rev Lett 102(25):256103
Bennewitz R, Foster AS, Kantorovich LN, Bammerlin M, Loppacher C, Schar S, Guggisberg M, Meyer E, Shluger AL (2000) Atomically resolved edges and kinks of NaCl islands on Cu(111): experiment and theory. Phys Rev B 62(3):2074–2084
Klust A, Ohta T, Bostwick AA, Yu QM, Ohuchi FS, Olmstead MA (2004) Atomically resolved imaging of a CaF bilayer on Si(111): subsurface atoms and the image contrast in scanning force microscopy. Phys Rev B 69(3):035405
Filleter T, Paul W, Bennewitz R (2008) Atomic structure and friction of ultrathin films of KBr on Cu(100). Phys Rev B 77(3):035430
Holscher H, Allers W, Schwarz UD, Schwarz A, Wiesendanger R (2000) Interpretation of “true atomic resolution” images of graphite (0001) in noncontact atomic force microscopy. Phys Rev B 62(11):6967–6970
Hembacher S, Giessibl FJ, Mannhart J, Quate CF (2003) Revealing the hidden atom in graphite by low-temperature atomic force microscopy. Proc Natl Acad Sci U S A 100(22):12539–12542
Kawai S, Kawakatsu H (2009) Surface-relaxation-induced giant corrugation on graphite (0001). Phys Rev B 79(11):115440
Ashino M, Schwarz A, Behnke T, Wiesendanger R (2004) Atomic-resolution dynamic force microscopy and spectroscopy of a single-walled carbon nanotube: characterization of interatomic van der Waals forces. Phys Rev Lett 93(13):136101
Loffler D, Uhlrich JJ, Baron M, Yang B, Yu X, Lichtenstein L, Heinke L, Buchner C, Heyde M, Shaikhutdinov S, Freund HJ, Wlodarczyk R, Sierka M, Sauer J (2010) Growth and structure of crystalline silica sheet on Ru(0001). Phys Rev Lett 105(14):146104
Lichtenstein L, Heyde M, Freund HJ (2012) Atomic arrangement in two-dimensional silica: from crystalline to vitreous structures. J Phys Chem C 116(38):20426–20432
Majzik Z, Tchalala MR, Svec M, Hapala P, Enriquez H, Kara A, Mayne AJ, Dujardin G, Jelinek P, Oughaddou H (2013) Combined AFM and STM measurements of a silicene sheet grown on the Ag(111) surface. J Phys Condens Matter 25(22):225301
Sun ZX, Hamalainen SK, Sainio J, Lahtinen J, Vanmaekelbergh D, Liljeroth P (2011) Topographic and electronic contrast of the graphene moire on Ir(111) probed by scanning tunneling microscopy and noncontact atomic force microscopy. Phys Rev B 83(8):081415
Boneschanscher MP, van der Lit J, Sun ZX, Swart I, Liljeroth P, Vanmaekelbergh D (2012) Quantitative atomic resolution force imaging on epitaxial graphene with reactive and nonreactive AFM probes. ACS Nano 6(11):10216–10221
Hamalainen SK, Boneschanscher MP, Jacobse PH, Swart I, Pussi K, Moritz W, Lahtinen J, Liljeroth P, Sainio J (2013) Structure and local variations of the graphene moire on Ir(111). Phys Rev B 88(20):6
Dedkov Y, Voloshina E (2014) Multichannel scanning probe microscopy and spectroscopy of graphene moire structures. Phys Chem Chem Phys 16(9):3894–3908
Fukui K, Onishi H, Iwasawa Y (1997) Imaging of individual formate ions adsorbed on TiO2(110) surface by non-contact atomic force microscopy. Chem Phys Lett 280(3–4):296–301
Rahe P, Nimmrich M, Nefedov A, Naboka M, Woll C, Kuhnle A (2009) Transition of molecule orientation during adsorption of terephthalic acid on rutile TiO2(110). J Phys Chem C 113(40):17471–17478
Schutte J, Bechstein R, Rahe P, Rohlfing M, Kuhnle A, Langhals H (2009) Imaging perylene derivatives on rutile TiO2(110) by noncontact atomic force microscopy. Phys Rev B 79(4):045428
Loske F, Bechstein R, Schutte J, Ostendorf F, Reichling M, Kuhnle A (2009) Growth of ordered C60 islands on TiO2(110). Nanotechnology 20(6):065606
Fremy S, Schwarz A, Lammle K, Prosenc M, Wiesendanger R (2009) The monomer-to-dimer transition and bimodal growth of Co-salen on NaCl(001): a high resolution atomic force microscopy study. Nanotechnology 20(40):405608
Lammle K, Trevethan T, Schwarz A, Watkins M, Shluger A, Wiesendanger R (2010) Unambiguous determination of the adsorption geometry of a metal-organic complex on a bulk insulator. Nano Lett 10(8):2965–2971
Pawlak R, Kawai S, Fremy S, Glatzel T, Meyer E (2011) Atomic-scale mechanical properties of orientated C(60) molecules revealed by noncontact atomic force microscopy. ACS Nano 5(8):6349–6354
Pawlak R, Kawai S, Fremy S, Glatzel T, Meyer E (2012) High-resolution imaging of C60 molecules using tuning-fork-based non-contact atomic force microscopy. J Phys Condens Matter 24(8):084005
Such B, Trevethan T, Glatzel T, Kawai S, Zimmerli L, Meyer E, Shluger AL, Amijs CHM, de Mendoza P, Echavarren AM (2010) Functionalized truxenes: adsorption and diffusion of single molecules on the KBr(001) surface. ACS Nano 4(6):3429–3439
Pawlak R, Fremy S, Kawai S, Glatzel T, Fang HJ, Fendt LA, Diederich F, Meyer E (2012) Directed rotations of single porphyrin molecules controlled by localized force spectroscopy. ACS Nano 6(7):6318–6324
Sasahara A, Uetsuka H, Onishi H (2001) NC-AFM topography of HCOO and CH(3)COO molecules co-adsorbed on TiO(2)(110). Appl Phys Mater Sci Process 72:S101–S103
Gritschneder S, Iwasawa Y, Reichling M (2007) Strong adhesion of water to CeO2(111). Nanotechnology 18(4):044025
Burke SA, Mativetsky JM, Fostner S, Grutter P (2007) C60 on alkali halides: epitaxy and morphology studied by noncontact AFM. Phys Rev B 76(3):035419
Burke SA, Ledue JM, Topple JM, Fostner S, Grutter P (2009) Relating the functional properties of an organic semiconductor to molecular structure by nc-AFM. Adv Mater 21(20):2029–2033
Gotsmann B, Seidel C, Anczykowski B, Fuchs H (1999) Conservative and dissipative tip-sample interaction forces probed with dynamic AFM. Phys Rev B 60(15):11051–11061
Lantz MA, Hoffmann R, Foster AS, Baratoff A, Hug HJ, Hidber HR, Guntherodt HJ (2006) Site-specific force-distance characteristics on NaCl(001): measurements versus atomistic simulations. Phys Rev B 74(24):245426
Hoffmann R, Barth C, Foster AS, Shluger AL, Hug HJ, Guntherodt HJ, Nieminen RM, Reichling M (2005) Measuring site-specific cluster-surface bond formation. J Am Chem Soc 127(50):17863–17866
Hembacher S, Giessibl FJ, Mannhart J, Quate CF (2005) Local spectroscopy and atomic imaging of tunneling current, forces, and dissipation on graphite. Phys Rev Lett 94(5):056101
Albers BJ, Schwendemann TC, Baykara MZ, Pilet N, Liebmann M, Altman EI, Schwarz UD (2009) Data acquisition and analysis procedures for high-resolution atomic force microscopy in three dimensions. Nanotechnology 20(26):264002
Holscher H, Langkat SM, Schwarz A, Wiesendanger R (2002) Measurement of three-dimensional force fields with atomic resolution using dynamic force spectroscopy. Appl Phys Lett 81(23):4428–4430
Ashino M, Schwarz A, Holscher H, Schwarz UD, Wiesendanger R (2005) Interpretation of the atomic scale contrast obtained on graphite and single-walled carbon nanotubes in the dynamic mode of atomic force microscopy. Nanotechnology 16(3):S134–S137
Schwarz A, Holscher H, Langkat SM, Wiesendanger R (2003) Three-dimensional force field spectroscopy. AIP Conf Proc 696:68–78
Bhushan B (2002) Introduction to tribology. Wiley, New York
Bhushan B (2005) Nanotribology and nanomechanics: an introduction. Springer, Berlin
Giessibl FJ, Herz M, Mannhart J (2002) Friction traced to the single atom. Proc Natl Acad Sci U S A 99(19):12006–12010
Atabak M, Unverdi O, Ozer HO, Oral A (2009) Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement. Appl Surf Sci 256(5):1299–1303
Weymouth AJ, Meuer D, Mutombo P, Wutscher T, Ondracek M, Jelinek P, Giessibl FJ (2013) Atomic structure affects the directional dependence of friction. Phys Rev Lett 111(12):126103
Kawai S, Glatzel T, Koch S, Such B, Baratoff A, Meyer E (2010) Ultrasensitive detection of lateral atomic-scale interactions on graphite (0001) via bimodal dynamic force measurements. Phys Rev B 81(8):085420
Ternes M, Lutz CP, Hirjibehedin CF, Giessibl FJ, Heinrich AJ (2008) The force needed to move an atom on a surface. Science 319(5866):1066–1069
Weymouth AJ, Hofmann T, Giessibl FJ (2013) Quantifying molecular stiffness and interaction with lateral force microscopy. Science 343:1120–1122
Welker J, Giessibl FJ (2012) Revealing the angular symmetry of chemical bonds by atomic force microscopy. Science 336(6080):444–449
Kimura K, Ido S, Oyabu N, Kobayashi K, Hirata Y, Imai T, Yamada H (2010) Visualizing water molecule distribution by atomic force microscopy. J Chem Phys 132(19):194705
Asakawa H, Yoshioka S, Nishimura K, Fukuma T (2012) Spatial distribution of lipid headgroups and water molecules at membrane/water interfaces visualized by three-dimensional scanning force microscopy. ACS Nano 6(10):9013–9020
Sugimoto Y, Jelinek P, Pou P, Abe M, Morita S, Perez R, Custance O (2007) Mechanism for room-temperature single-atom lateral manipulations on semiconductors using dynamic force microscopy. Phys Rev Lett 98(10):106104
Sugimoto Y, Pou P, Custance O, Jelinek P, Abe M, Perez R, Morita S (2008) Complex patterning by vertical interchange atom manipulation using atomic force microscopy. Science 322(5900):413–417
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Baykara, M.Z. (2015). Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces. In: Kumar, C.S.S.R. (eds) Surface Science Tools for Nanomaterials Characterization. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-44551-8_8
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