Abstract
The final chapter deals with transmission soft X-ray microscopy (TXM). Similar to the optical microscopes described in previous chapters, M-TXM is a pure photon-based technique, but harnesses the specific properties of X-rays, which provides higher spatial resolution, larger penetration depth, quantifiable and element-specific magnetic information, and a temporal resolution which is set by the time structure of the X-ray sources in use. TXMs are becoming now even commercially available products, and are available at most current synchrotron facilities worldwide. This chapter describes the basic instrument components of TXMs and will exemplify their use for layer-resolved (and time-resolved) magnetic microscopies by a few selected examples.
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Notes
- 1.
These substrates are also commonly used in transmission electron microscopy (TEM).
- 2.
A completely different approach of X-ray based imaging is the current development of lensless imaging. Although in principle these techniques should be only limited by the wavelength, so far the spatial resolution obtained for magnetic imaging is far away from that limit [377, 378].
- 3.
The latest generation of a full-field TXM has been recently installed at BESSY [379, 380]. This instrument provides high spectral resolution, which makes it unique for spectro-microscopy studies, with a clear advantage particularly for multi-dimensional imaging. However, the current undulator source does not provide polarized light and therefore magnetic imaging is not (yet) implemented.
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The complementarity of Lorentz TEM and M-TXM with regard to in-plane versus out-of-plane sensitivity of the magnetization allows for interesting studies of various aspects in identical systems.
- 5.
Nanoheater devices on Si\(_3\)N\(_4\) membranes, which have been developed for nanocalorimetry of thin films [405], provide a reliable platform for TXM measurements at elevated temperatures up to several 100 \({^\circ }\)C.
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Kuch, W., Schäfer, R., Fischer, P., Hillebrecht, F.U. (2015). Magnetic Transmission Soft X-Ray Microscopy. In: Magnetic Microscopy of Layered Structures. Springer Series in Surface Sciences, vol 57. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-44532-7_5
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DOI: https://doi.org/10.1007/978-3-662-44532-7_5
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