Abstract
Instead of letting the magnetization reach thermal equilibrium before each scan, a pulse sequence is presented, which applies a combination of RF-pulses and magnetic field gradients to spoil any magnetization in any direction of a sample located in an external magnetic field to produce a net nuclear magnetization, the spoiler recovery (SR) sequence. The basic assumption made is that the state of the nuclear spins at the end of the sequence is comparable to the state without any external applied magnetic field, i.e. the directions of the nuclear spins are randomly oriented in space. Due to the presence of the external magnetic field, the net nuclear magnetization will re-equilibrate along the external magnetic field due to T1 relaxation processes. Using a wait delay equal to T1 after the spoil process, already 63 % of the magnetization present at thermal equilibrium is regained. The wait time between each scan is then reduced to practically zero, as the ordinary 5 times T1 recycle delay is no longer necessary to achieve identical conditions between the accumulating scans. Using a spoiler recovery delay equal to T1, the total experimental time is reduced by 80 % without any major loss of signal to noise. Likewise, the use of the spoiler recovery approach can reduce the acquisition time of two dimensional experiments, as Diffusion-T2 or T1-T2, from the order of hours to the order of minutes. The SR approach is verified using external magnetic fields ranging from 0.047 to 14.1 T. At the highest fields it is also verified that the SR approach can be used to circumvent effects due to radiation damping. A set of applications using the spoiler recovery approach to reduce the acquisition time will be presented, designed either for low or for high external magnetic field.
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Sørland, G.H. (2014). The Spoiler Recovery Approach (SR). In: Dynamic Pulsed-Field-Gradient NMR. Springer Series in Chemical Physics, vol 110. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-44500-6_6
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DOI: https://doi.org/10.1007/978-3-662-44500-6_6
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