Abstract
As scientific and engineering interests in nanoscale structures increase, there is a strong need to fabricate nanometric surface and interface patterns with high regularity, reliability, and controllability. Formation of nanometric patterns on surfaces and thin films is often carried out with advanced nanolithography techniques, such as electron and ion beam lithography (Broers in Electrochem. Soc. 128:166, 1981; Ruchhoeft et al. in J. Vac. Sci. Technol. B 19:2529, 2001 [1, 2]), nanoimprint (Zhang and Chou in Appl. Phys. Lett. 79:845, 2001 [3]), X-ray lithography (Di Fabrizio et al. in J. Phys. Condens. Matters 16:S3517, 2004 [4]), and local scanning probe microscopy method (Tseng et al. in J. Vac. Sci. Technol. B 23:877, 2005 [5])
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
A.V.J. Broers, Resolution limits of PMMA resist for exposure with 50 kV electrons. Electrochem. Soc. 128, 166–170 (1981)
P. Ruchhoeft, J.C. Wolfe, R.J. Bass, Ion beam aperture-array lithography. J. Vac. Sci. Technol. B 19, 2529–2532 (2001)
W. Zhang, S.Y. Chou, Multilevel nanoimprint lithography with submicron alignment over 4 in. Si wafers. Appl. Phys. Lett. 79, 845–847 (2001)
E. Di Fabrizio, R. Fillipo, S. Cabrini, R. Kumar, F. Perennes, M. Altissimo, L. Businaro, D. Cojac, L. Vaccari, M. Prasciolu, P. Candelero, X-ray lithography for micro- and nano-fabrication at ELETTRA for interdisciplinary applications. J. Phys. Condens. Matters 16, S3517–S3535 (2004)
A.A. Tseng, A. Notargiacomo, T.P. Chen, Nanofabrication by scanning probe microscope lithography: a review. J. Vac. Sci. Technol. B 23, 877–894 (2005)
G. Yooa, H. Leea, D. Radtkeb, M. Stumpfb, U. Zeitnerb, J. Kanickia, A maskless laser-write lithography processing of thin-film transistors on a hemispherical surface. Microelectron. Eng. 87(1), 83–87 (2010)
Y. Chan, Y. Lam, Y. Zhou, F. Xu, C. Liaw, W. Jiang, J. Ahn, Development and applications of a laser writing lithography system for maskless patterning. Opt. Eng. 37(9), 2521–2530 (1998)
M. Kuwahara, C. Mihalcea, N. Atoda, J. Tominaga, H. Fuji, T. Kikukawa, A Thermal lithography technique using a minute heat spot of a laser beam for 100 nm dimension fabrication, in Optical nanotechnologies: the manipulation of surface and local plasmons, ed. by J. Tominaga, D.P. Tsai (Springer, Berlin, 2003)
J. Wei, F. Gan, Theoretical explanation of different crystallization processes between as-deposited and melted-quenched amorphous Ge2Sb2Te5 thin films. Thin Solid Films 441, 292–297 (2003)
J. Wei, H. Ruan, F. Gan, Analysis of short wavelength recording properties of AgInSbTe thin films. Proc. SPIE 5060, 163–166 (2003)
A. Dun, J. Wei, F. Gan, Laser direct writing pattern structures on AgInSbTe phase change thin film. Chin. Opt. Lett. 9, 082101 (2011)
C. Deng, Y. Geng, Y. Wu, Y. Wang, J. Wei, Adhesion effect of interface layers on pattern fabrication with GeSbTe as laser thermal lithography film. Microelectron. Eng. 103, 7–11 (2013)
J. Wei, Q. Liu, M. Xiao, Laser pulse induced micro-patterning on sandwiched thin films. Appl. Surf. Sci. 280, 89–92 (2013)
J. Wei, X. Jiao, F. Gan, M. Xiao, Laser pulse induced bumps in chalcogenide phase change films. J. Appl. Phys. 103, 124516 (2008)
J. Wei, J. Liu, X. Jiao, Subwavelength direct laser writing by strong optical nonlinear absorption and melt-ablation threshold characteristics. Appl. Phys. Lett. 95, 241105 (2009)
X. Jiao, J. Wei, F. Gan, M. Xiao, Temperature dependence of thermal properties of Ag8In14Sb55Te23 phase-change memory materials. Appl. Phys. A 94, 627–631 (2009)
J. Liu, J. Wei, Optical nonlinear absorption characteristics of AgInSbTe phase change thin films. J. Appl. Phys. 106, 083112 (2009)
X. Jiao, J. Wei, F. Gan, Si underlayer induced nano-ablation in AgInSbTe thin films. Chin. Phys. Lett. 25, 201–209 (2008)
J. Wei, R. Wang, Maskless direct laser writing with visible light: breaking through the optical resolving limit with cooperative manipulations of nonlinear reverse saturation absorption and thermal diffusion. J. Appl. Phys. 115, 123102 (2014)
G. Bouwhuis, J.H.M. Sprui, Optical storage read-out nonlinear disks. Appl. Opt. 29, 3766–3768 (1990)
Y. Choi, J.H. Park, M.R. Kim, W. Jhe, B.K. Rhee, Direct observation of self-focusing near the diffraction limit in polycrystalline silicon film. Appl. Phys. Lett. 78, 856–858 (2001)
M. Xiao, Theoretical treatment for scattering scanning near-field optical microscopy. J. Opt. Soc. Am. A 14, 2977–2984 (1997)
A. Dun, J. Wei, F. Gan, Pattern structures fabricated on ZnS–SiO2/AgOx/ZnS–SiO2 Thin film structure by laser direct writing technology. Appl. Phys. A 100, 401–407 (2010)
A. Dun, J. Wei, F. Gan, Marangoni effect induced micro/nano-patterning on Sb2Te3 phase change thin film by laser pulse. Appl. Phys. A 103, 139–147 (2011)
R. Wang, J. Wei, Y. Fan, Chalcogenide phase-change thin films used as grayscale photolithography materials. Opt. Exp. 22(5), 4973–4984 (2014)
X. Ma, J. Wei, Nanoscale lithography with visible light: optical nonlinear saturable absorption effect induced nanobump pattern structures. Nanoscale 3, 1489–1492 (2011)
J. Wei, M. Xiao, Super-resolution scanning laser microscopy with a third-order optical nonlinear thin film. Appl. Phys. B 91, 337–341 (2008)
J. Wei, M. Xiao, The origin of the super-resolution via a nonlinear thin film. Opt. Commun. 281, 1654–1661 (2008)
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2015 Science Press, Beijing and Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Wei, J. (2015). Applications of Nonlinear Super-Resolution Effects in Nanolithography and High-Resolution Light Imaging. In: Nonlinear Super-Resolution Nano-Optics and Applications. Springer Series in Optical Sciences, vol 191. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-44488-7_9
Download citation
DOI: https://doi.org/10.1007/978-3-662-44488-7_9
Published:
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-662-44487-0
Online ISBN: 978-3-662-44488-7
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)