Abstract
A transmission Kossel camera for the AMX microprobe is described, which provides facilities for investigating any selected region of the specimen.
A technique for the determination of orientations from Kossel patterns is briefly summarized, and the application of the method is illustrated by means of an example. In combination with a computer programme the method provides a rapid means of orientation determination and is particularly useful in investigations where large numbers of orientations must be determined (e.g. preferred orientation studies).
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Hälbig, H., Ryder, P.L., Pitsch, W. (1969). Technique for Orientation Determinations by Means of Kossel Diffraction in the Electron Microprobe. In: Möllenstedt, G., Gaukler, K.H. (eds) Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-24778-5_65
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DOI: https://doi.org/10.1007/978-3-662-24778-5_65
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-662-22845-6
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