Abstract
The instrument described here is a development of the Materials Analysis Company Model 400 X-ray microprobe analyzer. It incorporates all the X-ray microanalysis capabilities of the earlier instrument, and in addition allows scanned electron images to be formed with up to 1,000 Å resolution.
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© 1969 Springer-Verlag Berlin Heidelberg
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Macres, V.G., Preston, O., Yew, N.C., Buchanan, R. (1969). A Combined Scanning Electron Microscope/Electron Microprobe Analyzer. In: Möllenstedt, G., Gaukler, K.H. (eds) Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-24778-5_56
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DOI: https://doi.org/10.1007/978-3-662-24778-5_56
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-662-22845-6
Online ISBN: 978-3-662-24778-5
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