Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse pp 305-310 | Cite as
Effect of Electron Source to Energy Resolution in Electron Velocity Analysis — Interpretation of Boersch Effect
In 1954, Boersch  reported that a width of the emission spectrum of an electron beam increases with the beam current or the current density. Those experiments were carried out by a retarding potential analyzer at a beam energy of 30 kV. Later, similar experiments were repeated by several workers with using energy analyzers of various type [2–4]. All those workers agreed that the velocity distribution was broadened so that the effective cathode temperature might be as high as 3 × 104 °K, i.e. at least ten times the real temperature.
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