Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse pp 84-92 | Cite as
A Study of the Deadtime Correction in Electron Probe Microanalysis
The magnitude of the deadtime correction must be known in quantitative electron microprobe analyses since failure to apply the correction can lead to errors in the measured relative X-ray intensity ratio, k, which often are of the same magnitude as the precision in the determination of k; even greater errors will result when analyzing dilute alloys while using pure element standards. Heinrich, Vieth and Yakowitz  developed a simple method of determining the deadtime, τ, in the electron microprobe based on the model proposed by Ruark and Brammer  where the true counting rate, N t 0 , is given by N 0/(1-τN 0) and N 0 is the measured X-ray intensity from a pure element. Several investigators [3–7] have reported that τ is a function of the counting rate and becomes essentially zero below intensities varying from 4,000 to 14,000 cps [3–6]; in the Ruark  model, τ is independent of intensity. In an attempt to resolve this problem, a careful comparison was made between the current method described by Heinrich et al. , and the ratio method, which gives a range of zero deadtime, or negligible coincidence loss, described by Short , and Borile, Short and Tabock . The deadtimes of the electronic components were measured, both individually and as complete counting systems, in an attempt to identify the deadtime source and to correlate X-ray (current and ratio methods) and electronic deadtimes.
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