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Diffraction Contrast and Crystal-Structure Imaging

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Transmission Electron Microscopy

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 36))

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Abstract

A crystal can be imaged with the primary beam (bright field) or with a Bragg reflection (dark field). The local intensity depends on the thickness, resulting in thickness contours, and on the tilt of the lattice planes, resulting in bend contours, which can be described by the dynamical theory of electron diffraction. In certain cases, the intensity of a Bragg reflection depends so sensitively on specimen thickness that atomic surface steps can be observed.

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  1. Physikalisches Institut, Westfälische Wilhelms-Universität Münster, Wilhelm-Klemm-Str. 10, D-4400, Münster, Fed. Rep. of Germany

    Prof. Dr. Ludwig Reimer

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© 1989 Springer-Verlag Berlin Heidelberg

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Reimer, L. (1989). Diffraction Contrast and Crystal-Structure Imaging. In: Transmission Electron Microscopy. Springer Series in Optical Sciences, vol 36. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-21579-1_8

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  • DOI: https://doi.org/10.1007/978-3-662-21579-1_8

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