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Scattering and Phase Contrast for Amorphous Specimens

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Transmission Electron Microscopy

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 36))

Abstract

Elastic scattering through angles larger than the objective aperture causes absorption of the electron at the objective diaphragm and a decrease of transmitted intensity. This scattering contrast can be explained by particle optics. The exponential decrease of transmission with increasing specimen thickness can be used for quantitative determination of mass-thickness or of the total mass of an amorphous particle, for example. The zero-loss mode of electron spectroscopic imaging allows us to increase the contrast by removing inelastically scattered electrons; alternatively the contrast can be increased by energy-filtering at higher energy losses.

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  1. Physikalisches Institut, Westfälische Wilhelms-Universität Münster, Wilhelm-Klemm-Strasse 10, D-48149, Münster, Germany

    Professor Dr. Ludwig Reimer

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© 1997 Springer-Verlag Berlin Heidelberg

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Reimer, L. (1997). Scattering and Phase Contrast for Amorphous Specimens. In: Transmission Electron Microscopy. Springer Series in Optical Sciences, vol 36. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-14824-2_6

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  • DOI: https://doi.org/10.1007/978-3-662-14824-2_6

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