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Electron Holography pp 69–106Cite as

Electron-Holographic Interferometry

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Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 70))

Abstract

When holography is employed, the phase distribution of an electron beam transmitted through or reflected from a sample can be displayed as an interference micrograph. Although an interference micrograph can also be obtained without recourse to holography if we use an electron microscope equipped with an electron biprism (Sect.3.2), electron holography allows contour maps to be observed and the phase to be measured with a precision as high as 27π/100. The development of electron-holographic interferometry allows us to see objects that were not visible when using conventional electron microscopes in which only the intensity of an electron beam is observed.

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Authors and Affiliations

  1. Advanced Research Laboratory, Hitachi, Ltd. and Tonomura Electron Wavefront Project, Exploratory Research for Advanced Technology, Research Development Corporation of Japan, Hatoyama, Saitama, 350-03, Japan

    Dr. Akira Tonomura

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  1. Dr. Akira Tonomura
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© 1993 Springer-Verlag Berlin Heidelberg

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Tonomura, A. (1993). Electron-Holographic Interferometry. In: Electron Holography. Springer Series in Optical Sciences, vol 70. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-13913-4_7

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  • DOI: https://doi.org/10.1007/978-3-662-13913-4_7

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-13915-8

  • Online ISBN: 978-3-662-13913-4

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