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Elemental Analysis and Imaging with X-Rays

  • Ludwig Reimer
Chapter
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Part of the Springer Series in Optical Sciences book series (SSOS, volume 45)

Abstract

For quantitative x-ray microanalysis, the number of x-ray quanta in characteristic lines produced by the specimen and by a pure element standard or one of known concentration are counted. The concentration of the element in the specimen can be calculated from the ratio of these counts. However, several corrections are necessary since various factors are different for specimen and standard: the backscattering and the stopping power, which depend on atomic number (Z); the x-ray absorption (A); and the fluorescence (F). The ZAF correction programs developed for x-ray microprobes at normal incidence can also be used quantitatively in SEM for normal and tilted specimens. For small particles and films on substrates and for biological specimens, special correction problems have to be taken into account. X-ray fluorescence analysis can be employed in SEM at some sacrifice of spatial resolution.

Keywords

Electron Bombardment Mass Attenuation Coefficient Electron Range Tilted Specimen Absorption Correction Factor 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1985

Authors and Affiliations

  • Ludwig Reimer
    • 1
  1. 1.Physikalisches InstitutWestfätlische Wilhelms-Univeraität MünsterMünsterFed. Rep. of Germany

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