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Introduction

  • Ludwig Reimer
Chapter
Part of the Springer Series in Optical Sciences book series (SSOS, volume 36)

Abstract

Although the main concern of this book is transmission electron microscopy, the functions and limits of the other types of electron microscopes are also mentioned in this introductory chapter to show the advantages and disadvantages of their various imaging techniques. Several types of electron microscopes and analysing instruments capable of furnishing an “image” can be distinguished. We now examine these briefly, in turn, without considering the historical sequence in which these instruments were developed. In these background sections, references are restricted to review articles and books.

Keywords

Inelastic Scattering Scan Transmission Electron Microscope Spherical Aberration Conventional Transmission Electron Microscope Emission Electron Microscope 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1984

Authors and Affiliations

  • Ludwig Reimer
    • 1
  1. 1.Physikalisches InstitutWestfälische Wilhelms-Universität MünsterMünsterFed. Rep. of Germany

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