Elements of X-Ray Physics and Crystallography
X-ray multiple-wave diffraction, like the usual two-wave Bragg diffraction, is an interference phenomenon between X-rays and a periodic crystal lattice. The detection of this phenomenon relies on the conditions of carrying out the diffraction experiments, which often involve X-ray sources and crystals. In this chapter, the experimental aspects of the currently available X-ray sources are described. The fundamentals of crystallography concerning reciprocal lattice and the factors affecting intensity measurements are briefly reviewed as well. The latter include the structure factor, absorption coefficient, Lorentz-polarization factor due to crystal rotation and the beam polarization. Other inelastic processes associated with X-ray diffraction like absorption and fluorescence are also mentioned.
KeywordsSynchrotron Radiation Storage Ring Electron Density Distribution Reciprocal Lattice Bragg Reflection
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