Elements of X-Ray Physics and Crystallography

  • Shih-Lin Chang
Part of the Springer Series in Solid-State Sciences book series (SSSOL, volume 143)

Abstract

X-ray multiple-wave diffraction, like the usual two-wave Bragg diffraction, is an interference phenomenon between X-rays and a periodic crystal lattice. The detection of this phenomenon relies on the conditions of carrying out the diffraction experiments, which often involve X-ray sources and crystals. In this chapter, the experimental aspects of the currently available X-ray sources are described. The fundamentals of crystallography concerning reciprocal lattice and the factors affecting intensity measurements are briefly reviewed as well. The latter include the structure factor, absorption coefficient, Lorentz-polarization factor due to crystal rotation and the beam polarization. Other inelastic processes associated with X-ray diffraction like absorption and fluorescence are also mentioned.

Keywords

Hexagonal Peri Tral Dura 

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Copyright information

© Springer-Verlag Berlin Heidelberg 2004

Authors and Affiliations

  • Shih-Lin Chang
    • 1
  1. 1.Department of PhysicsNational Tsing Hua UniversityHsinchuTaiwan, R.O.C.

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