Skip to main content

Silicon Nitride in Compound Semiconductor Integrated Circuits (ICs)

  • Chapter
Si Silicon

Part of the book series: Si. Silicium. Silicon (System-Nr. 15) ((2074,volume S-i / B / 1-5 / 5 / c))

  • 307 Accesses

Abstract

Silicon nitride is applied in monolithic, integrated, digital, and analog circuits composed of FETs, diodes, resistors, and thin-film capacitors on compound semiconductor substrates. Silicon nitride can be used as a mask for implanting Si to produce n-type layers and for implanting hydrogen to achieve isolation by generating radiation damage. It can also be used for encapsulating before annealing, providing recessed Mo-Au gates, and for passivation [1,2]. ICs on GaAs with a high degree of integration are fabricated by the same technique by preparing patterned multilayers consisting of a silicon nitride layer sandwiched with a silicon oxide and a PSG layer prior to annealing and preparing contacts and gate contacts [3]. Highspeed, ion-implanted GaAs ICs are annealed using a silicon nitride oxide layer for encapsulation. The silicon nitride oxide layer is deposited in a mixture of SiH4, NH3, and 02 at 923 K. The subsequent annealing is performed at 1073 K [4]. Alternatively, GaAs specimens are coated with a silicon nitride oxide layer, patterned, implanted with silicon ions, encapsulated with a silicon nitride layer, and annealed to prepare high-speed GaAs ICs [5].

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 1,459.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Van Tuyl, R. L; Kumar, V.; D’Avanzo, D. C; Taylor, T. W.; Peterson, V. E.; Hornbuckle, D. P.; Fisher, R. A.; Estreich, D. B. (IEEE Trans. Microwave Theory Tech. MTT-30 [1982] 935/42; C.A. 98 [1983] No. 82083).

    Article  Google Scholar 

  2. Van Tuyl, R. L; Kumar, V.; D’Avanzo, D. C; Taylor, T. W.; Peterson, V. E.; Hornbuckle, D. P.; Fisher, R. A.; Estreich, D. B. (IEEE Trans. Electron Devices ED-29 [1982] 1031/8; C.A. 98 [1983] No. 99527).

    Article  Google Scholar 

  3. Hitachi Ltd. (Japan. Kokai Tokkyo Koho 60–53086 [1985] from C.A. 103 [1985] No. 133395).

    Google Scholar 

  4. NEC Corp. (Japan. Kokai Tokkyo Koho 60–39825 [1985] from C.A. 103 [1985] No. 80530).

    Google Scholar 

  5. NEC Corp. (Japan. Kokai Tokkyo Koho 60–39826 [1985] from C.A. 103 [1985] No. 80531).

    Google Scholar 

  6. Odekirk, B.; Sheets, J. (Proc. Electrochem. Soc. 86–3 [1986] 274/86; C.A. 104 [1986] No. 140224).

    Google Scholar 

  7. Mitsubishi Electric Corp. (Japan. Kokai Tokkyo Koho 59–167028 [1983/84] from C.A. 102 [1985] No. 104588).

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 1991 Springer-Verlag Berlin Heidelberg

About this chapter

Cite this chapter

Krimmel, E.F., Hezel, R., Nohl, U., Bohrer, R. (1991). Silicon Nitride in Compound Semiconductor Integrated Circuits (ICs). In: Pebler, A., Schröder, F. (eds) Si Silicon. Si. Silicium. Silicon (System-Nr. 15), vol S-i / B / 1-5 / 5 / c. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-09901-8_25

Download citation

  • DOI: https://doi.org/10.1007/978-3-662-09901-8_25

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-09903-2

  • Online ISBN: 978-3-662-09901-8

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics