Abstract
Magnetic force microscopy is commonly understood as a scanning force microscopy technique that is devoted to the measurement of tip-sample forces mediated by a magnetic field. In fact, every scanning force microscope can be used as a magnetic force microscope, if a tip with a magnetic moment is used. Then the SFM becomes sensitive to magnetic fields emanating from the surface of a sample. However, other types of tips that are sensitive to magnetic fields may also be used. Examples are microfabricated Hall probes, magnetoresistive sensors, and superconductive quantum interference devices (SQUIDS).
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© 2004 Springer-Verlag Berlin Heidelberg
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Meyer, E., Hug, H.J., Bennewitz, R. (2004). MFM and Related Techniques. In: Scanning Probe Microscopy. Advanced Texts in Physics. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-09801-1_4
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DOI: https://doi.org/10.1007/978-3-662-09801-1_4
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-07737-1
Online ISBN: 978-3-662-09801-1
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