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MFM and Related Techniques

  • Ernst Meyer
  • Hans Josef Hug
  • Roland Bennewitz
Part of the Advanced Texts in Physics book series (ADTP)

Abstract

Magnetic force microscopy is commonly understood as a scanning force microscopy technique that is devoted to the measurement of tip-sample forces mediated by a magnetic field. In fact, every scanning force microscope can be used as a magnetic force microscope, if a tip with a magnetic moment is used. Then the SFM becomes sensitive to magnetic fields emanating from the surface of a sample. However, other types of tips that are sensitive to magnetic fields may also be used. Examples are microfabricated Hall probes, magnetoresistive sensors, and superconductive quantum interference devices (SQUIDS).

Keywords

Domain Wall Magnetic Force Microscopy Magnetic Image Stray Field Bloch Wall 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2004

Authors and Affiliations

  • Ernst Meyer
    • 1
  • Hans Josef Hug
    • 1
  • Roland Bennewitz
    • 1
  1. 1.Institute of PhysicsUniversity of BaselBaselSwitzerland

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