Abstract
Recently, ferroelectric materials, especially in thin film form, have attracted the attention of many researchers. Their large dielectric constants make them suitable as dielectric layers of microcapacitors in microelectronics. They are also investigated for application in nonvolatile memory using the switchable dielectric polarization of ferroelectric material. To characterize such ferroelectric materials, a highresolution tool is required for observing the microscopic distribution of remanent (or spontaneous) polarization of ferroelectric materials.
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References
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© 2004 Springer-Verlag Berlin Heidelberg
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Cho, Y. (2004). Scanning Nonlinear Dielectric Microscopy for Investigation of Ferroelectric Polarization. In: Alexe, M., Gruverman, A. (eds) Nanoscale Characterisation of Ferroelectric Materials. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-08901-9_5
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DOI: https://doi.org/10.1007/978-3-662-08901-9_5
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-05844-8
Online ISBN: 978-3-662-08901-9
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