Abstract
Recent progress in oxide electronic devices including microelectromechanical systems (MEMS), non-volatile ferroelectric memories (FeRAMs), and ferroelectric heterostructures necessitates an understanding of local ferroelectric properties on the nanometer level. This has motivated a number of studies of ferroelectric materials with various scanning probe microscopies (SPM) [l–3], many examples of which can be found in this text. The natures of the probe and contrast formation mechanisms in these techniques are vastly different; therefore, SPM images reflect different properties of ferroelectric surfaces.
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Kalinin, S.V., Bonnell, D.A. (2004). Electric Scanning Probe Imaging and Modification of Ferroelectric Surfaces. In: Alexe, M., Gruverman, A. (eds) Nanoscale Characterisation of Ferroelectric Materials. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-08901-9_1
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DOI: https://doi.org/10.1007/978-3-662-08901-9_1
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