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Electric Scanning Probe Imaging and Modification of Ferroelectric Surfaces

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Book cover Nanoscale Characterisation of Ferroelectric Materials

Part of the book series: NanoScience and Technology ((NANO))

Abstract

Recent progress in oxide electronic devices including microelectromechanical systems (MEMS), non-volatile ferroelectric memories (FeRAMs), and ferroelectric heterostructures necessitates an understanding of local ferroelectric properties on the nanometer level. This has motivated a number of studies of ferroelectric materials with various scanning probe microscopies (SPM) [l–3], many examples of which can be found in this text. The natures of the probe and contrast formation mechanisms in these techniques are vastly different; therefore, SPM images reflect different properties of ferroelectric surfaces.

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Authors
  1. S. V. Kalinin
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  2. D. A. Bonnell
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Editor information

Editors and Affiliations

  1. Max Planck Institute of Microstructure Physics, Weinberg 2, 06120, Halle (Saale), Germany

    Marin Alexe

  2. Department of Materials Science and Engineering, North Carolina State University, Campus Box 7920, 27695, Raleigh, NC, USA

    Alexei Gruverman

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© 2004 Springer-Verlag Berlin Heidelberg

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Kalinin, S.V., Bonnell, D.A. (2004). Electric Scanning Probe Imaging and Modification of Ferroelectric Surfaces. In: Alexe, M., Gruverman, A. (eds) Nanoscale Characterisation of Ferroelectric Materials. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-08901-9_1

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  • DOI: https://doi.org/10.1007/978-3-662-08901-9_1

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-05844-8

  • Online ISBN: 978-3-662-08901-9

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