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Segmentierung von Nadeldiagrammen von Objekten mit gekrümmten Oberflächen

  • Conference paper
Mustererkennung 1988

Part of the book series: Informatik-Fachberichte ((INFORMATIK,volume 180))

Zusammenfassung

Eine Sammlung von lokalen Oberflächennormalenvektoren wird als Nadeldiagramm(engl. needle map) bezeichnet. Es gibt viele Ansätze zur Gewinnung eines Nadeldiagramms, während das Problem der Segmentierung von Nadeldiagrammen bisher wenig untersucht wurde. Dieser Beitrag präsentiert einen Algorithmus, der die Segmentierung direkt im Nadeldiagramm durchführt. Dank ihrer 3-D Natur sind sowohl das Nadeldiagramm als auch seine segmentierte Version nützlich für verschiedene Aufgaben der Bildanalyse. Resultate werden gezeigt für Bilder von 3-D Objekten mit planaren und gekrümmten Oberflächen.

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Author information

Authors and Affiliations

  1. Institut für Informatik und angewandte Mathematik, Universität Bern, Länggassstrasse 51, 3012, Bern, Schweiz

    X. Y. Jiang & H. Bunke

Authors
  1. X. Y. Jiang
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  2. H. Bunke
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Editor information

Editors and Affiliations

  1. Institut für Informatik und angewandte Mathematik, Universität Bern, Länggass-Straße 51, CH-3012, Bern, Schweiz

    Horst Bunke

  2. Institut für Kommunikationstechnik, ETH-Zentrum, CH-8092, Zürich, Schweiz

    Olaf Kübler

  3. Institut für Informatik, Universität Zürich, Winterthurerstraße 190, CH-8057, Zürich, Schweiz

    Peter Stucki

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© 1988 Springer-Verlag Berlin Heidelberg

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Jiang, X.Y., Bunke, H. (1988). Segmentierung von Nadeldiagrammen von Objekten mit gekrümmten Oberflächen. In: Bunke, H., Kübler, O., Stucki, P. (eds) Mustererkennung 1988. Informatik-Fachberichte, vol 180. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-08895-1_35

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  • DOI: https://doi.org/10.1007/978-3-662-08895-1_35

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-50280-7

  • Online ISBN: 978-3-662-08895-1

  • eBook Packages: Springer Book Archive

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