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Three-Dimensional Reciprocal Space Mapping: Application to Polycrystalline CVD Diamond

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Diffraction Analysis of the Microstructure of Materials

Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 68))

Abstract

The principles and practice of three-dimensional reciprocal-space mapping (3D-RSM) for studying polycrystalline materials are outlined and compared with powder diffraction methods. Results obtained from applying 3D-RSM to polycrystalline chemical vapour-deposited (CVD) diamond films are presented and discussed. The experiments were performed using synchrotron radiation at SRS and ESRF.

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Authors
  1. M. Golshan
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  2. D. Laundy
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  3. P. F. Fewster
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  4. M. Moore
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Editor information

Editors and Affiliations

  1. Max Planck Institute for Metals Research, Heisenbergstrasse 3, 70569, Stuttgart, Germany

    Eric J. Mittemeijer

  2. Dipartimento di Ingegneria dei Materiali e Tecnologie Industriali, Università di Trento, Facoltà di Ingegneria, Via Mesiano 77, 38050, Mesiano, Italy

    Paolo Scardi

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© 2004 Springer-Verlag Berlin Heidelberg

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Golshan, M., Laundy, D., Fewster, P.F., Moore, M. (2004). Three-Dimensional Reciprocal Space Mapping: Application to Polycrystalline CVD Diamond. In: Mittemeijer, E.J., Scardi, P. (eds) Diffraction Analysis of the Microstructure of Materials. Springer Series in Materials Science, vol 68. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-06723-9_20

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  • DOI: https://doi.org/10.1007/978-3-662-06723-9_20

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-07352-6

  • Online ISBN: 978-3-662-06723-9

  • eBook Packages: Springer Book Archive

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