Determination of Non-uniform Dislocation Distributions in Polycrystalline Materials
Diffraction line broadening caused by dislocations is discussed for polycrystalline materials that consist of crystallites in which non-uniform dislocation distributions occur; i.e. not all glide systems contain the same density and/or type of dislocations. The discussion is illustrated by two practical examples. It is shown that for 111 textured Al layers sputter deposited on silicon, during deformation due to a biaxial stress, predominantly screw dislocations with Burgers vectors inclined to the specimen surface are formed. Whether one or more slip systems are active in each grain cannot be determined with the present experiments. It is also shown that in initially stressed Ni layers electrodeposited on steel the internal stress favours the annihilation of dislocations with Burgers vectors close to the maximum resolved shear stress.
KeywordsNickel Hexagonal Recrystallization Convolution Sine
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