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X-ray Peak Broadening Due to Inhomogeneous Dislocation Distributions

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Diffraction Analysis of the Microstructure of Materials

Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 68))

Abstract

An overview of the theory of X-ray line broadening caused by dislocation is presented. It is shown that the properties of the tails of the profile are determined by the average dislocation density, the dislocation density fluctuation, and the dislocation—dislocation correlation length. The obtained asymptotic behaviour is compared with the predictions of earlier models. The influence of the finite coherent domain size is also analysed. For the determination of the statistical parameters characterising the dislocation ensemble investigated a generalised form of Wilson’s variance method is outlined. The proposed evaluation method is demonstrated on line profiles measured on plastically deformed Cu single and AlMg polycrystals.

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Authors
  1. I. Groma
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  2. A. Borbély
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Editor information

Editors and Affiliations

  1. Max Planck Institute for Metals Research, Heisenbergstrasse 3, 70569, Stuttgart, Germany

    Eric J. Mittemeijer

  2. Dipartimento di Ingegneria dei Materiali e Tecnologie Industriali, Università di Trento, Facoltà di Ingegneria, Via Mesiano 77, 38050, Mesiano, Italy

    Paolo Scardi

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Groma, I., Borbély, A. (2004). X-ray Peak Broadening Due to Inhomogeneous Dislocation Distributions. In: Mittemeijer, E.J., Scardi, P. (eds) Diffraction Analysis of the Microstructure of Materials. Springer Series in Materials Science, vol 68. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-06723-9_11

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  • DOI: https://doi.org/10.1007/978-3-662-06723-9_11

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-07352-6

  • Online ISBN: 978-3-662-06723-9

  • eBook Packages: Springer Book Archive

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