Skip to main content

Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 69))

  • 999 Accesses

Abstract

Chemical mechanical planarization is an enabling technology for fabrication of leading edge semiconductor devices. Originally considered to be “dirty” and incompatible with cleanroom processes, CMP has evolved into a critical process technology that includes not only the planarization step, but the post-CMP cleaning process as well. It is used not only in back end of the line interconnect processes, but is also used for critical process steps in the fabrication of transistors and other key device elements — where control of contamination is crucial if the device is to be functional. The evolution of dry-in dry-out CMP equipment platforms has been key to the introduction of CMP processes in mainstream semiconductor manufacturing beginning with the 0.35 p.m technology node. If CMP is a key enabler in the manufacture of advanced semiconductor devices, then evolution of equipment platforms has enabled the use of CMP processes consistent with high volume manufacturing in a clean room environment. Going forward, automated process control for CMP will lead to further improvements in manufacturability, stability and predictive process results.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 169.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 219.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 219.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. H. Hocheng, Y.-L. Huang and L.-J. Chen, Journal Of The Electrochemical Society, 146 (11), 4236, November 1999.

    Google Scholar 

  2. D. White, D. Boning and A. Gower, Proceedings 2000 CMP—MIC Conference, 229, IMIC, Tampa, 2000.

    Google Scholar 

  3. W. Patrick, W. Guthrie, C. Standley and P. Schiable, Journal Of The Electrochemical Society, 138 (6), 1778, June 1991.

    Google Scholar 

  4. H. Hocheng and 11.-Y. Tsai, Proceedings 1997 CMP—MIC Conference, 277, IMIC, Tampa, 1997.

    Google Scholar 

  5. R. Kolenkow and R. Nagahara, Solid State Technology, 35 (6), 112, June 1992.

    Google Scholar 

  6. J. Breivogel, S. Louke, M. Oliver, L. Yau and C. Barns, US Patent 5,554,064, September 10, 1996.

    Google Scholar 

  7. M. Tuttle, T. Doan. A. Fox, G. Sandhu and H. Stroupe, US Patent 5,232,875, August 3, 1993.

    Google Scholar 

  8. K.H. Lee, Y.B. Lee and S.W. Kang, US Patent 6,315,641, November 13, 2001.

    Google Scholar 

  9. N. Shendon, and D. Smith, US Patent 5,582,534, December 10, 1996.

    Google Scholar 

  10. K. Honda, US Patent 6,042,459, March 28, 2000.

    Google Scholar 

  11. H. Talieh, and D. Weldon, H., US Patent 5,692,947, December 2, 1997.

    Google Scholar 

  12. R. Jairath, S. Chadda, E. Engdahl, W. Krusell, T. Mallon, K. Mishra, A. Pant and B. Withers, Proceedings 1997 CMP—MIC Conference, 194, IMIC, Tampa, 1997.

    Google Scholar 

  13. A. Pant, D. Young, A. Meyer, K. Volodarsky and D. Weldon, US Patent 5,800,248, September 1, 1998.

    Google Scholar 

  14. H. Talieh, US Patent 6,207,572, March 27, 2001.

    Google Scholar 

  15. A. Yoshio, CMP Technology For ULSI Interconnection, Pp.K1 — K10, ISBN 1–892568–50–0, SEMICON West, San Francisco, July, 2000.

    Google Scholar 

  16. Y. Saimitsu, Chemical Mechanical Planarization In IC Device Manufacturing III, Electrochemical Society Proceedings, 99–37, 546, Honolulu, Hawaii, October 1999.

    Google Scholar 

  17. T. Donohue, R. Williams, J. Barber, J. Hoshizaki, L. Lee, C.-L. Meng and P. Sommer, US Patent 6,312,319, November 6, 2001.

    Google Scholar 

  18. J. Hoshizaki, R. Williams, J. Buhler, C. Reichel, W. Hollywood, R. de Geus and L. Lee, US Patent 5,759,918, June 2, 1998.

    Google Scholar 

  19. Y. Homma, S. Kondo, N. Sakuma, K. Hinode, J. Noguchi, N. Ohashi, H. Yamaguchi and N. Owada, Chemical Mechanical Planarization In IC Device Manufacturing III, Electrochemical Society Proceedings, 99–37 83, Honolulu, Hawaii, October 1999.

    Google Scholar 

  20. H. Talieh, US Patent 6,176,922, January 23, 2001.

    Google Scholar 

  21. H. Talieh and C. Uzoh, US Patent 6,328,872, December 11, 2001.

    Google Scholar 

  22. R. Contolini, S. Mayer and L. Tarte, US Patent 5,486,234, January 23, 1996.

    Google Scholar 

  23. S. Mayer, R. Contolini and A. Bernhardt, US Patent 5,096,550, March 17, 1992.

    Google Scholar 

  24. H. Wang, US Patent 6,248,222, June 19, 2001.

    Google Scholar 

  25. M.H. Tsai, S.W. Chou, C.L. Chang, C.H. Hsieh, M.W. Lin, C.M. We, W.S. Shue, D.C. Yu and M.S. Liang, Tech. Dig. 2001 IEDM, 80, Washington, DC, December 2001.

    Google Scholar 

  26. C. Uzoh and J. Harper, US Patent 5,807,165, September 15, 1998.

    Google Scholar 

  27. S. Sato, Z. Yasuda, M. Ishihara, N. Komai, H. Ohtorii, A. Yoshio, Y. Segawa, H. Horikoshi, Y. Ohoka, K. Tai, S. Takahashi and T. Nogami, Tech. Dig. 2001 IEDM, 84, Washington, DC, December 2001.

    Google Scholar 

  28. G. Gill and T. Hyde, US Patent 4,944,119, July 31, 1990.

    Google Scholar 

  29. N. Shendon, K.C. Struven and R. Kolenkow, US Patent 5,205,082, April 27, 1993.

    Google Scholar 

  30. H. Kobayashi, H. Miyairi and O. Endo, US Patent 5,584,751, December 17, 1996.

    Google Scholar 

  31. N. Shendon, US Patent 5,624,299, April 29, 1997.

    Google Scholar 

  32. J. Schlueter, S. Schultz, N. Korovin and F. Elkhodr, CAMP 6th International CMP Symposium, Lake Placid, New York, August, 2001.

    Google Scholar 

  33. Steven Zuniga,US Patent 6,244,942; June 12, 2001.

    Google Scholar 

  34. Tom Hyde, Westech Systems, Private Communication.

    Google Scholar 

  35. M. Oliver, R. Schmidt and M. Robinson, Chemical Mechanical Planarization In IC Device Manufacturing IV, Electrochemical Society Proceedings, 2000–26 77, Fourth International Symposium On Chemical Mechanical Planarization In Integrated Circuit Manufacturing, Fall Meeting Of The Electrochemical Society, Phoenix, Arizona, October, 2000.

    Google Scholar 

  36. C.-Y. Chen, C.-C. Yu, S.-H. Shen and M. Ho, Journal Of The Electrochemical Society, 147 (10), 3922, October, 2000.

    Google Scholar 

  37. Noritake, Private Communication.

    Google Scholar 

  38. G. Sandhu, L. Schultz and T. Doan, US Patent 5,036,015, July 30, 1991.

    Google Scholar 

  39. Luxtron Corporation, Private Communication.

    Google Scholar 

  40. N. Gitis, M. Vinogradov and C. Gao, “Quantitative Evaluation Of CMP Processes And Materials Using A CMP Tester With Multiple Sensors”, Proceedings Of The Second International Conference On Microelectronics And Interfaces, American Vacuum Society, Santa Clara, California, February, 2001.

    Google Scholar 

  41. A. Fukuroda, K. Nakamura and Y. Arimoto, “In Situ CMP Monitoring Technique For Multi-layer Interconnection”, Technical Digest 1995 IEDM, Pp. 469472, Washington, DC, December 1995.

    Google Scholar 

  42. T. Kojima, M. Miyajima, F. Akaboshi, T. Yogo, S. Ishimoto and A. Okuda, IEEE Transactions On Semiconductor Manufacturing, 13 (3), 291, August, 2000.

    Google Scholar 

  43. J. Tang, C. Unger, Y. Moon and D. Dornfeld, “Low-k Dielectric Material Chemical Mechanical Polishing (CMP) Process Monitoring Using Acoustic Emission”, Abstract N3.7, Abstracts Of The Spring 1997 Meeting Of The Materials Research Society, San Francisco, California, March 31 — April 4, 1997.

    Google Scholar 

  44. L. Li, C. Wei, J. Gilhooly and C. Morgan, “End Point Detection In Metal And Nitride-Containing CMP Processes”, Proceedings Of The Second International Conference On Microelectronics And Interfaces,American Vacuum Society, Santa Clara, California, February, 2001.

    Google Scholar 

  45. G. Dishon, D. Eylon, M. Finarov and A. Shulman, Proceedings 1998 CMP—MIC Conference, 267, IMIC, Tampa, 1998.

    Google Scholar 

  46. N. Patel, G. Miller, C. Guinn and S. Jenkins, “Device Dependent Control Of Chemical-Mechanical Polishing Of Dielectric Films”, IEEE Transactions On Semiconductor Manufacturing, 13 (3), 33, August, 2000.

    Google Scholar 

  47. B. Adams, B. Swedek, R. Bajaj, K. Wijekoon, S. Nanjangud, A. Wiswesser, S. Tsai, D. Chan, F. Redeker and M. Birang, Proceedings Of 2000 CMP—MIC Conference, 267, IMIC, Tampa, 2000.

    Google Scholar 

  48. T. Laursen and M. Grief, Chemical-Mechanical Polishing 2001 — Advances And Future Challenges, Materials Research Society Symposium Proceedings, 671, Pp. M7.6.1–6, San Francisco, California, April, 2001.

    Google Scholar 

  49. V. Bhaskaran, C. Chen, R. Allen, K. Lehman, H. Chen, D. Watts and B. Stephenson, “Advanced In-SituEnd-Point Control System For CMP Applications”, CMP Users Group Meeting, American Vacuum Society, Santa Clara, California, October 2001.

    Google Scholar 

Download references

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2004 Springer-Verlag Berlin Heidelberg

About this chapter

Cite this chapter

Tucker, T. (2004). Equipment Used in CMP Processes. In: Oliver, M.R. (eds) Chemical-Mechanical Planarization of Semiconductor Materials. Springer Series in Materials Science, vol 69. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-06234-0_5

Download citation

  • DOI: https://doi.org/10.1007/978-3-662-06234-0_5

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-07738-8

  • Online ISBN: 978-3-662-06234-0

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics