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Scanning probe microscopy

  • Bengt Nölting

Abstract

Scanning probe microscopes generate a highly-resolved image of the specimen by scanning it with a small mechanical, electrical, optical, thermal, or other probe.

Keywords

Atomic Force Microscope Scanning Tunneling Microscope Scanning Probe Microscopy Subwavelength Aperture Electrochemical Scanning Tunneling Microscopy 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2004

Authors and Affiliations

  • Bengt Nölting
    • 1
  1. 1.Preussisches Privatinstitut für Technologie zu BerlinBerlinGermany

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