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X-Ray Photoelectron Spectroscopy

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Surface Analysis Methods in Materials Science

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 23))

Abstract

The detection and energy analysis of photoelectrons produced by radiation whose energy exceeds their binding energies is the subject of an extensively-used technique known as Photoelectron (PE) Spectroscopy. This technique can be conveniently divided into two broad areas, the first employing ultraviolet radiation, hence called Ultraviolet Photoelectron Spectroscopy (UPS), and the second using X-rays, termed X-ray Photoelectron Spectroscopy (XPS). The latter spectroscopy is the subject of this present chapter, while UPS is discussed in Chap. 14.

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  1. M. H. Kibel
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Editors and Affiliations

  1. School of Mathematical and Physical Sciences, University Newcastle, 2308, Callaghan, NSW, Australia

    D. John O’Connor

  2. CSIRO Manufacturing Science and Technology, Private Bag 33, 3169, Clayton South, VIC, Australia

    Brett A. Sexton

  3. South Australian Surface Technology Centre, University of South Australia, 25095, The Levels, Adelaide, SA, Australia

    Roger St. C. Smart

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Kibel, M.H. (2003). X-Ray Photoelectron Spectroscopy. In: O’Connor, D.J., Sexton, B.A., Smart, R.S.C. (eds) Surface Analysis Methods in Materials Science. Springer Series in Surface Sciences, vol 23. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-05227-3_7

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