Abstract
Electron microscopy in its various forms has developed over the past fifty years into one of the major techniques of materials science. Surface analytical techniques are more recent additions to the materials scientists’ range of experimental methods for learning about materials properties. Microscopy and spectroscopy are complementary, and the use of one alone can result in an inadequate characterization of a material. In this chapter we will consider the various modes of electron microscopy and attempt to demonstrate the critical importance of applying electron optical imaging together with surface analytical techniques in studies of surfaces.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
J.A. Venables, D.J. Smith, J.M. Cowley: HREM, STEM, REM SEM and STM, Surf. Sci. 181, 235 (1987), see also J.A. Venables: Ultramicroscopy 7, 81 (1981)
A. Howie, U. Valdre (eds.): Surface and Interface Characterization by Electron Optical Methods; Proc. NATO ASI, Erice 1987 (Plenum, New York 1988)
P.K. Larson, P.J. Dobson (eds.): Reflection High-Energy Electron Diffraction and Reflection Imaging of Surfaces, Proc. NATO ASI, Veldhoven 1987 (Plenum, New York 1988)
J.A. Venables, D.J. Smith (eds.): Proceedings of Workshop on Surfaces and Surface Reactions, Wickenberg Inn, Arizona, 1989: Ultramicroscopy 31 (1989)
P.J. Goodhew: Electron Microscopy and Analysis (Wykeham, London 1975);
P.J. Goodhew, F.J. Humphreys: Electron Microscopy and Analysis, 2nd edn. (Taylor and Francis, London 1988)
P.W. Hawkes: Electron Optics and Electron Microscopy (Taylor and Francis, London 1972)
I.M. Watt: The Principles and Practice of Electron Microscopy (Cambridge University Press, Cambridge 1985; Second edition 1997)
J.I. Goldstein, D.E. Newbury, P. Echlin, D.C. Joy, C. Fiori, E. Lifshin: Scanning Electron Microscopy and X-ray Microanalysis (Plenum, New York 1981)
L. Reimer: Scanning Electron Microscopy, Springer Ser. Opt. Sci. Vol. 45 (Springer Berlin, Heidelberg 1985; Second completely revised and updated edition 1998)
L. Reimer: Transmission Electron Microscopy, Springer Ser. Opt. Sci., Vol.36 (Springer Berlin, Heidelberg 1984; fourth edition 1997)
J.M. Cowley: Diffraction Physics, 2nd edn. (North Holland, Amsterdam 1981)
A.E. Ringwood: Safe Disposal of High Level Nuclear Reactor Wastes (ANU, Canberra 1978);
J.A. Cooper, D.R. Cousens, R.A. Lewis, S. Myhra, R.L. Segall, R.StC. Smart, P.S. Turner: J. Am. Ceram. Soc. 68, 64 (1985)
A.F. Moodie, C.E. Warble: J. Cryst. Growth 10, 26 (1971)
D. Cherns: Phil. Mag. 30, 549 (1974)
K. Kambe, G. Lehmpfuhl: Optik 42, 187 (1975);
G. Lehmpfuhl, Y. Uchida: Ultramicroscopy 4, 275 (1979)
M. Klaua, H. Bethge: Ultramicroscopy 11, 125 (1983)
K. Takayanagi, Y. Tanashiro, M. Takahashi, S. Takahashi: J. Vac. Sci. Technol. A3, 1502 (1985)
L.D. Marks, D.J. Smith: Nature 303, 316 (1983);
D.J. Smith: Surf. Sci. 178, 462 (1986)
L.D. Marks: Surf. Sci. 139, 281 (1984)
For reviews of REM, see K. Yagi: J. Appl. Cryst. 20, 147 (1987);
K. Yagi: Electron microscopy of surface structure, Adv. Opt. Elec. Microsc. 11, 57 (1989)
N. Osakabe, Y. Tanashiro, K. Yagi, G. Honjo: Japan J. Appl. Phys. 19, L309 (1980);
N. Osakabe, Y. Tanashiro, K. Yagi, G. Honjo: Surf. Sci. 109, 353 (1981)
Y. Tanishiro, K. Takayanagi: Ultramicroscopy 31, 20 (1989)
T. Nagatani, S. Saito: Proc. 11th Int. Conf. Elec. Microsc, Kyoto, Japan (1986) 2101; K. Ogura, M. Kersker: Proc. 46th EMSA (1988) p. 204
E. Bauer: Ultramicroscopy 17, 51 (1985);
E. Bauer, M. Mundschau, W. Swiech, W. Telieps: Ultramicroscopy 31, 49 (1989)
G.G. Hembree, P.A. Crozier, J.S. Drucker, M. Krishnamurthy, J.A. Venables, J.M. Cowley: Ultramicroscopy 31, 111 (1989)
D.C. Joy: Monte Carlo Modelling for E.M. and Microanalysis (Oxford University Press, Oxford, 1995)
V.N.E. Robinson: J. Microscopy, 103, 71 (1975)
G.D. Danilatos: Micron and Microscopica Acta, 14, 307 (1983)
B.J. Griffin: Scanning, 22, 234 (2000)
J.L. Pouchou, F Pichoir: Scanning, 12, 212 (1990)
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2003 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Turner, P.S., Nockolds, C.E., Bulcock, S. (2003). Electron Microscope Techniques for Surface Characterization. In: O’Connor, D.J., Sexton, B.A., Smart, R.S.C. (eds) Surface Analysis Methods in Materials Science. Springer Series in Surface Sciences, vol 23. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-05227-3_3
Download citation
DOI: https://doi.org/10.1007/978-3-662-05227-3_3
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-07458-5
Online ISBN: 978-3-662-05227-3
eBook Packages: Springer Book Archive