Abstract
X-ray Absorption Fine Structure (XAFS) spectroscopy is an important technique for determining the local structure around an absorbing element in a sample. It is normally divided into two techniques: Extended XAFS (EXAFS) describing the fine structure more than about 50 eV above an absorption edge, and near edge structure or XANES. In an X-ray absorption spectrum, a series of oscillations in the measured absorption coefficient can be observed on the high-energy side of an absorption edge. These oscillations are due to the fact that the final state wavefunction of the emitted photoelectron consists of an outgoing part and a part that is scattered from neighbouring atoms. The EXAFS oscillations, as they are known, correspond to an interferogram of the spatial distribution of nearby atoms and can be analysed to provide structural information about the local environment of the absorbing atom such as bond length, the number and type of neighbouring atoms, bond angles and a measure of order/disorder and/or chemical lability. EXAFS typically gives very accurate interatomic distances, in particular for nearest neighbours, of the order of ±0.02 Å or better. Achieving precision in the determination of coordination number is more difficult and errors as large as 20% in the fitted result are common. Careful choice of suitable standard compounds with known structure followed by EXAFS analysis, however, can greatly improve this determination.
Keywords
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
“X-Ray Absorption: Principles, Applications, Techniques of EXAFS, SEXAFS and XANES”, Eds. D.C. Koningsberger and R. Prins, Wiley, New York, 1988
J. Stohr, “NEXAFS Spectroscopy”, Springer, Berlin, 1992
“X-Ray Absorption Fine Structure for Catalysts and Surfaces”, Ed. Y. Iwasawa, World Scientific, Singapore, 1996
The proceedings, of XAFS X held in 1998, appears as volume 6 part 3 of the Journal of Synchrotron Radiation, 1999. The XAFS XI proceedings will be volume 8 of J. Synchrotron Rad,
See for example the web site of the International XAFS Society at http://ixs.csrri.iit.edu/IXS/index.html
D.E. Sayers, E.A. Stern, F.W. Lytle: Phys. Rev. Lett. 27, 1204 (1971)
see for example “Applications of Synchrotron Radiation”, eds. H. Winick, D. Xian, M. Ye, T. Huang, Gordon and Breach, New York, 1989
B.M. Kincaid, P. Eisenberger: Phys. Rev. Lett. 34, 1361 (1975)
Y. Udagawa, [3, p. 130]
J. Wong, Z.U. Rek, M. Rowen, T. Tanaka, F. Schafers, B. Muller, G.N. George, I.J. Pickering, G. Via, B. DeVries, G.E. Brown, M. Froba: Physica B208/209, 220 (1995)
T. Matsushita, R.P. Phizackerley: J. Appl. Phys. 20, 2223 (1981)
M. Hagelstein, C. Ferrero, M. Sanchez del Rio, U. Hatje, T. Ressler, W. Metz: Physica, B208/209 223 (1995)
R. Frahm: Nucl. Instrum. Methods A270 (1988) 578;
R. Frahm: Synchrotron Radiation News 8 38 (1995)
L.M. Murphy, B.R. Dobson, M. Neu, C.A. Ramsdale, R.W. Strange, S.S. Hasnain: J. Synchrotron Rad. 2, 64 (1995)
F.W. Lytle, R.B. Greegor, D.R. Sandstrom, E.C. Marques, J. Wong, C.L. Shapiro, G.P. Huffman, F.E. Huggins: Nucl. Instrum. Methods 226, 542 (1984)
S.P. Cramer, O. Tench, M. Yocum, G.N. George: Nucl. Instrum. Methods A266, 586 (1988)
J. Stohr, R. Jaeger, S. Brennan: Surf. Sci. 117, 502 (1982)
F. Farges, J.-P. Itie, G. Fiquet, D. Andrault: Nucl. Instrum. Methods B101, 493 (1995)
D.J. Thiel, P. Livins, E.A. Stern, A. Lewis: Nature 362, 40 (1993)
F.A. Schultz, B.J. Feldman, S. Gheller, W.E. Newton, B. Hedman, P. Frank, K.O. Hodgson: “Redox Mechanisms and Interfacial Properties of Molecules of Biological Importance V”, Proc. Vol. 93–11, F.A. Schultz and I. Taniguchi, eds. Pennington N.J.: The Electrochemical Society, Inc. pp. 108, 1993
I. Ascone, A. Cognigni, M. Giorgetti, M. Berrettoni, S. Zamponi, R. Marassi: J. Synchrotron Rad., 6, 384 (1999)
A. Yoshiasa, T. Nagai, O. Ohtaka, O. Kamishima, O. Shimomura: J. Synchrotron Rad. 6, 43 (1999)
D. Bazin, H. Dexpert, J. Lynch: [3, p. 113]
An interesting and informative history of XAFS is given by Lytle, J. Synchrotron Rad. 6, 123 (1999)
S.J. Gurman, J. Synchrotron Rad. 2, 56 (1995)
E.D. Crozier: Nucl. Instrum. Methods B133, 134 (1997)
D. Koningsberger, B. Moget, J. Miller, D. Ramaker: J. Synchrotron Rad. 6, 135 (1999)
D.E. Ramaker, W.E. O’Grady: J. Synchrotron Rad. 6, 800 (1999)
E.A. Stern: Phys. Rev. B 10, 3027 (1974)
G. Bunker: Nucl. Instrum. Methods 207, 437 (1983)
E.D. Crozier: [1, Chap. 9]
C. Bourder: J. Phys. Condens. Matter 2, 701 (1990)
J.J. Rehr, R.C. Albers, S.I. Zabinsky: Phys. Rev. Lett. 69, 3397 (1992)
S.I. Zabinsky, J.J. Rehr, A. Ankudinov, R.C. Albers, M.J. Eller: Phys. Rev. B 52, 2995 (1995)
J.J. Rehr, R.C. Albers: Rev. Mod. Phys. (2000)
Workshop report: “Molecular Environmental Science: Speciation, Reactivity and mobility of Environmental Contaminants. An Assessment of Research Opportunities and the Need for Synchrotron Radiation Facilities.” SLAC-R-95–477, 1995
P.J. Ellis, H.C. Freeman: J. Synchrotron Rad. 2, 190 (1995)
XAFS International Workshop Report in “X-ray Absorption Fine Structure”, ed. S.S. Hasnain, Ellis Horwood, New York, 1990.
J.W. Cook, D.E. Sayers: J. Appl. Phys. 52, 5024 (1981)
N. Binstead, R.W. Strange, S.S. Hasnain: Biochemistry 31, (1992) 12117
A. Filipponi, A. Di Cicco, T.A. Tyson, C.R. Natoli: Solid State Commun. 78, 265 (1991)
E.A. Stern: J. Vac. Sci. Technol. 14, 461 (1977)
T.L. Einstein: App. Surf. Sci. 11/12, 42 (1982)
R. Fox, S.J. Gurman: J. Phys. C 13, L249 (1980)
S.M. Heald, E. Keller, E.A. Stern: Phys. Lett. 103A, 155 (1984)
S.M. Heald, H. Chen, J.M. Tranquada: Phys. Rev. B 38, 1016 (1988)
M. Shirai, Y. Iwasawa: [3, p. 332]
B.A. Bunker, A.J. Kropf, K.M. Kemmer, R.A. Mayanovic, Q. Lu: Nucl. Instrum. Methods B133, 102 (1997)
T.L. Hanley, V. luca, I. Pickering, R.F. Howe: to be published.
T.L. Hanley, Y. Krisnandi, A. Eldewik, V. Luca, R.F. Howe: Ionics, submitted
C.J. Glover, M.C. Ridgeway, K.M. Yu, G.J. Foran, C. Clerc, J. Hansen, A. Nylandsted Larsen: J. Synchrotron Rad. 8, 2001, in press
M.C. Ridgway, C.J. Glover: private communication
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2003 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Garrett, R.F., Foran, G.J. (2003). EXAFS. In: O’Connor, D.J., Sexton, B.A., Smart, R.S.C. (eds) Surface Analysis Methods in Materials Science. Springer Series in Surface Sciences, vol 23. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-05227-3_15
Download citation
DOI: https://doi.org/10.1007/978-3-662-05227-3_15
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-07458-5
Online ISBN: 978-3-662-05227-3
eBook Packages: Springer Book Archive