Abstract
There is a set of various analytical techniques which employ an ion beam to probe a surface. The most widely used techniques are as follows.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
C. Linsmeier, H. Knözinger, E. Taglauer: Ion Scattering and Auger Electron Spectroscopy Analysis of Alumina-Supported Rhodium Model Catalyst. Surf. Sci. 275, 101 (1992)
H. Niehus: ‘Ion Scattering Spectroscopic Techniques’. In: Practical Surface Analysis. Vol. 2. Ion and Neutral Spectroscopy 2nd edn. ed. by D. Briggs, M.P. Seah (John Wiley, Chichester 1992) pp. 507–576.
R.S. Williams: ‘Quantitative Intensity Analysis of Low-Energy Scattering and Recoiling from Crystal Surfaces’. In: Low Energy Ion-Surface Interactions ed. by J.W. Rabalais (John Wiley, Chichester 1994) pp. 1–54
J.A. Cookson: ‘Analytical Techniques’. In: Principles and Applications of High-Energy Microbeams ed. by F. Watt, G.W. Grime (IOP Publishing, England 1987) pp. 21–78
C.S. Barrett, R.M. Müller, W. White: Proton Blocking in Cubic Crystals. J. Appl. Phys. 39, 4695 (1968)
L.C. Feldman, J.W. Mayer, S.T. Picraux: Materials Analysis by Ion Channeling. Submicron Crystallography (Academic Press, New York 1982)
J.P. Ziegler, J.P. Biersack, U. Littmark: The Stopping Power and Range of Ions in Solids, Vol. 1 (Pergamon Press, New York 1985)
I.H. Wilson, S.S. Todorov, D.S. Karpuzov: Profile Evolution During Ion Beam Etching of Clean Germanium Targets. Nuclear Instr. Methods Phys. Res. 209–210, 549 (1983)
H.D. Hagstrum: Theory of Auger Injection of Electrons from Metals by Ions. Phys. Rev. 96, 336 (1954)
R.L. Erickson, D.P. Smith: Oscillatory Cross Section in Low-Energy Ion Scattering from Surfaces. Phys. Rev. Lett. 34, 297 (1975)
D.P. Woodruff, T.A. Delchar: Modern Techniques of Surf. Sci., 2nd edn. (Cambridge University Press, Cambridge 1994)
H. Niehus, E. Preuss: Low Energy Alkali Backscattering at Pt(111). Surf. Sci. 119, 349 (1982)
H. Niehus: Enhancement of the ICISS by Simultaneous Detection of Ions and Neutrals. Surf. Sci. 166, L107 (1986)
M. Aono, C. Oshima, S. Zaima, S. Otani, Y. Ishizawa: Quantitative Surface Atomic Geometry and Two-Dimensional Surface Electron Distribution Analysis by a New Technique in Low-Energy Ion Scattering. Japan J. Appl. Phys. 20, L829 (1981)
M. Katayama, E. Nomura, N. Kanekama, H. Soejima, M. Aono: Coaxial Impact-Collision Ion Scattering Spectroscopy a Novel Method for Surface Structure Analysis. Nuclear Instr. Methods Phys. Res. B 33, 857 (1988)
M. Aono, M. Katayama, E. Nomura, T. Chassè, M. Kato: Recent Development in Low-Energy Ion Scattering Spectroscopy (ISS) for Surface Structural Analysis. Nuclear Instr. Methods Phys. Res. B 37, 264 (1989)
M. Aono, Y. Hou, C. Oshima, Y. Ishizawa: Low-Energy Ion Scattering from the Si(100) surface. Phys. Rev. Lett. 49, 567 (1982)
I. Stensgaard, L.C. Feldman, P.J. Silverman: Calculation of the Backscattering-Channeling Surface Peak. Surf. Sci. 77, 513 (1978)
L.C. Feldman, R.L. Kauffman, P.J. Silverman, R.A. Zuhr, J.H. Barrett: Surface Scattering from W Single Crystal by MeV He + Ions. Phys. Rev. Lett. 39, 38 (1977)
W.C. Turkenburg, W. Soszka, F.W. Saris, H.H. Kersten, B.G. Colenbrander: Surface Structure Analysis by Means of Rutherford Scattering: Methods to Study Surface Relaxation. Nuclear Instr. Methods Phys. Res. 132, 587 (1976)
J.W.M. Frenken, F. Huussen, J.F. van der Veen: Evidence for Anomalous Thermal Expansion at a Crystal Surface. Phys. Rev. Lett. 58, 401 (1987)
F. Shoji, K. Kusumura, K. Oura: A Si(100)-2×H Monohydride Surface Studied by Low-energy Recoil-Ion Spectroscopy. Surf. Sci. 280, L247 (1993)
A. Benninghoven: Comparative Study of Si(111), Silicon Oxide, SiC and Si 3 N 4 Surfaces by Secondary Ion Mass Spectroscopy (SIMS). Thin Solid Films 28, 59 (1975)
A. Benninghoven: Developments in Secondary Ion Mass Spectroscopy and Applications to Surface Studies. Surf. Sci. 53, 596 (1975)
A. Casel, H. Jorke, M. Pawlik, R. Groves, E. Frenzel: A Comparison of Electrical and Chemical Profiling of Dopant Superlattices in Silicon. J. Appl. Phys. 67, 1740 (1990)
Further Reading
J.W. Rabalais (Ed.): Low Energy Ion-Surface Interactions (John Wiley, Chichester 1994) (about LEIS)
J.F. Van der Veen: Ion Beam Crystallography of Surfaces and Interfaces. Surf. Sci. Rep. 5, 199–288 (1985) (about MEIS and RBS crystallography)
L.C. Feldman, J.W. Mayer, S.T. Picraux: Materials Analysis by Ion Channeling (Academic Press, New York 1982) (on the physics underlying RBS)
D. Briggs, M.P. Seah (Ed.): Practical Surface Analysis. Vol. 2. Ion and Neutral Spectroscopy (John Wiley, Chichester 1992) (about LEIS, MEIS and SIMS)
P. Varga, H. Winter: ‘Slow Particle-Induced Electron Emission from Solid Surfaces’. In: Particle Induced Electron Emission II (Springer, Berlin 1991) (about charge exchange between ions and surfaces)
D.P. Woodruff, T.A. Delchar: Modern Techniques of Surface Science, 2nd edn. (Cambridge University Press, Cambridge 1994) (about charge exchange between ions and surfaces).
A. Benninghoven, F.G. Rudenauer, H.W. Werner: Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications, and Trends (John Wiley, New York 1987) (the best SIMS reference)
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 2003 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Oura, K., Katayama, M., Zotov, A.V., Lifshits, V.G., Saranin, A.A. (2003). Surface Analysis III. Probing Surfaces with Ions. In: Surface Science. Advanced Texts in Physics. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-05179-5_6
Download citation
DOI: https://doi.org/10.1007/978-3-662-05179-5_6
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-05606-2
Online ISBN: 978-3-662-05179-5
eBook Packages: Springer Book Archive