Electron Diffraction and Crystallography

  • Brent Fultz
  • James M. Howe

Abstract

Reciprocal lattices of crystals are spanned by three reciprocal-lattice vectors, so the diffraction patterns of materials are inherently three-dimensional.

Keywords

Hexagonal Sine Eosine Mirror Symmetry FeS2 

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Further Reading

  1. The contents of the following are described in the Bibliography.Google Scholar
  2. J. A. Eades: ‘Convergent-Beam Diffraction’. In: Electron Diffraction Techniques, Volume 1 ed. by J. M. Cowley (International Union of Crystallography, Oxford University Press, Oxford 1992).Google Scholar
  3. J. W. Edington: Practical Electron Microscopy in Materials Science, 2. Electron Diffraction in the Electron Microscope (Philips Technical Library, Eindhoven 1975).Google Scholar
  4. C. Hammond: The Basics of Crystallography and Diffraction (International Union of Crystallography, Oxford University Press, Oxford 1977).Google Scholar
  5. O. Johari and G. Thomas: The Stereographic Projection and Its Applications (Interscience Publishers, John Wiley & Sons, New York 1969).Google Scholar
  6. J. C. H. Spence and J. M. Zuo: Electron Microdiffraction (Plenum Press 1992).Google Scholar
  7. J. W. Steeds and R. Vincent: ‘Use of High-Symmetry Zone Axes in Electron Diffraction in Determining Crystal Point and Space Groups’, J. Appl. Cryst. 16, 317 (1983).CrossRefGoogle Scholar
  8. J. W. Steeds: ‘Convergent Beam Electron Diffraction’. In: Introduction to Analytical Electron Microscopy ed. by J. J. Hren, J. I. Goldstein, D. C. Joy (Plenum Press, New York 1979) p. 401.Google Scholar
  9. M. Tanaka and M. Terauchi: Convergent-Beam Electron Diffraction (JEOL Ltd., Nakagami, Tokyo 1985).Google Scholar
  10. M. Tanaka, M. Terauchi and T. Kaneyama, Convergent-Beam Electron Diffraction II (JEOL Ltd., Musashino 3-chome, Tokyo 1988).Google Scholar
  11. G. Thomas and M. J. Goringe: Transmission Electron Microscopy of Materials (John Wiley & Sons, New York 1979).Google Scholar
  12. D. B. Williams and C. B. Carter: Transmission Electron Microscopy: A Textbook for Materials Science (Plenum Press, New York 1996).CrossRefGoogle Scholar

Chapter 6 title image of Kikuchi map of bcc crystal. G. Thomas and M. J. Goringe: Transmission Electron Microscopy of Materials (Wiley—Interscience, New York 1979). Figure reprinted with the courtesy of Wiley—Interscience

  1. 6.1
    G. Thomas and M. J. Goringe: Transmission Electron Microscopy of Materials (Wiley—Interscience, New York 1979). Figure reprinted with the courtesy of Wiley—Interscience.Google Scholar
  2. 6.2
    J. W. Edington: Practical Electron Microscopy in Materials Science, 2. Electron Diffraction in the Electron Microscope (Philips Technical Library, Eindhoven 1975). Figure reprinted with the courtesy of FEI Company.Google Scholar
  3. 6.3 Dr. J.-S. Chen, unpublished results.Google Scholar
  4. 6.4
    M. Tanaka and M. Terauchi: Convergent-Beam Electron Diffraction (JEOL Ltd., Nakagami, Tokyo 1985). Figures reprinted with the courtesy of JEOL, Ltd. Worked thickness example on pp. 38–39.Google Scholar
  5. 6.5
    R. Ayer: J. Electron Micros. Tech. 13, 16 (1989). Figure reprinted with the courtesy of Alan R. Liss, Inc.CrossRefGoogle Scholar
  6. 6.6
    S. J. Rozeveld: Measurement of Residual Stress in an Al-SiC, Composite by Convergent-Beam Electron Diffraction, Ph.D. Thesis, CarnegieMellon University, Pittsburgh, PA (1991). Figure reprinted with the courtesy of Dr. S. J. Rozeveld.Google Scholar
  7. 6.7
    B. F. Buxton, et al.: Proc. Roy. Soc. London A281, 188 (1976). B. F. Buxton, et al.: Phil. Trans. Roy. Soc. London, A281, 171 (1976). Tables reprinted with the courtesy of The Royal Society, London.Google Scholar
  8. 6.8
    M. Tanaka, H. Sekii and T. Nagasawa: Acta Cryst. A39, 825 (1983). Figure reprinted with the courtesy of the International Union of Crystallography.Google Scholar
  9. 6.9
    M. Tanaka, R. Saito and H. Sekii: Acta Cryst. A39, 359 (1983). Figure reprinted with the courtesy of International Union of Crystallography.Google Scholar
  10. 6.10
    J. M. Howe, M. Sarikaya and R. Gronsky: Acta Cryst. A42, 371 (1986). Figure reprinted with the courtesy of International Union of Crystallography.Google Scholar
  11. 6.11
    The International Union of Crystallography: International Tables for X-ray Crystallography (Kynock Press, Birmingham, England, 1952-).Google Scholar
  12. 6.12
    J. W. Steeds and R. Vincent: ‘Use of High-Symmetry Zone Axes in Electron Diffraction in Determining Crystal Point and Space Groups’, J. Appl. Cryst. 16 317 (1983).CrossRefGoogle Scholar
  13. 6.13
    J. GjØnnes and A. F. Moodie: Acta Cryst. 19, 65 (1965).CrossRefGoogle Scholar
  14. 6.14
    M. J. Kaufman and H. L. Fraser: Acta Metall. 33, 194 (1985). Figure reprinted with the courtesy of Elsevier Science Ltd.Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2002

Authors and Affiliations

  • Brent Fultz
    • 1
  • James M. Howe
    • 2
  1. 1.Division of Engineering and Applied ScienceCalifornia Institute of TechnologyPasadenaUSA
  2. 2.Department of Materials Science and EngineeringUniversity of VirginiaCharlottesvilleUSA

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