Abstract
This chapter is devoted to the optical properties of interfaces and thin films. An interface is a region of separation between two materials with different properties, on which the otherwise bulk-like character of particle motion suffers a change. At the same time, due to fluctuations at the microscopic level, local potential minima, which can trap carriers or impurities, can form along the interface. Although we make references to such localized quasiparticles, we distinguish between surface, as mainly a restriction of movement, and intentionally spatial confined structures such as low-dimensional heterostructures. In this respect, thin films are considered here as regions where the motion of carriers is restricted in a certain plane, but with sufficiently large thicknesses such that the main characteristic of spatial confinement, i.e. quantization of energy levels, does not manifest itself.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Ahn, J.S., U.S. Choi, and T.W. Noh (1996) Phys. Rev. B 53 10310.
Aspens, D.E. (1995) IEEE J. Selected Topics Quantum Electron. 1, 1054.
Beitia, C, W. Preyss, R. Del Sole, and Y. Borensztein (1997) Phys. Rev. B 56, 4371.
Breiland, W.G. and K.P. Killeen (1995) J. Appl. Phys. 78, 6726.
Callaway, J. (1991) Quantum Theory of Solid State, Academic Press, Boston, 2nd edition.
Chang, Y.M., L. Xu, and H.W.K. Tom (1999) Phys. Rev. B 59, 12220.
Chen, Y.H., Z. Yang, R.G. Li, Y.Q. Wang, and Z.G Wang (1997) Phys. Rev. B 55, 7379.
Chirita, M., G. Robins, R.L. Stamps, R. Sooryakumar, M.E. Filipkowski, G.J. Gutierrez, and G.A. Prinz (1998) Phys. Rev. B 58, 869.
Chirita, M., R. Sooryakumar, H. Xia, O.R. Monteiro, and I.G. Brown (1999) Phys. Rev. B 60,5153.
Erley, G. and W. Daum (1998) Phys. Rev. B 58, 1734.
Fang, J. and G.P. Li (1999) Appl. Phys. Lett. 75, 3506.
Garreau, G., E. Beaurepaire, K. Ounadjela, and M. Farbe (1996) Phys. Rev. B 53, 1083.
Gilliland, G.D., M.S. Petrovic, H.P. Hjalmarson, D.J. Wolford, G.A. Northrop, T.F. Kuech, L.M. Smith, and J.A. Bradley (1998) Phys. Rev. B 58, 4728.
Grimsditch, M., S. Kumar, and E.E. Fullerton (1996) Phys. Rev. B 54, 3385.
Grünberg, P. (1989) in Light Scattering in Solids V, eds. M. Cardona and G. Gtintherodt, vol.66 in Topics in Applied Physics, Springer, Berlin, Heidelberg, p.303.
Holtz, M., J.C. Carry, and W.M. Duncan (1999) Appl. Phys. Lett. 74, 2008.
Iwamoto, M., Y. Mizutani, and A. Sugimura (1996) Phys. Rev. B 54, 8186.
Jin, X.F., M.Y. Mao, S. Ko, and Y.R. Shen (1996) Phys. Rev. B 54, 7701.
Ju, G., A.V. Nurmikko, R.F.C. Farrow, R.F. Marks, M.J. Carey, and B.A. Gurney (1998) Phys. Rev. B 58, 11857.
Kondo, H., H. Mino, I. Akai, and T. Karasawa (1998) Phys. Rev. B 58, 13835.
Lastras-Martinez, A., R.E. Balderas-Navarro, L.F. Lastras-Martinez, and M.A. Vidal (1999) Phys. Rev. B 59, 10234.
Lee, C.C. and Y.J. Jen (1999) Appl. Opt. 38, 6029.
Lopez-Rios, T. and G. Vuye (1979) Surf. Sei. 81, 529.
Mihaychuk, J.G., N. Shamir, and H.M. van Driel (1999) Phys. Rev. B 59, 2164.
Mishina, T., H. Chida, and Y. Masumoto (1993) Phys. Rev. B 48, 1460.
Murayama, A., K. Hyomi, J. Eickmann, and CM. Falco (1998) Phys. Rev. B 58, 8596.
Osgood III R.M., B.M. Clemens, and R.L. White (1997) Phys. Rev. B 55, 8990.
Parker, CA., J.C Roberts, S.M. Bedair, M.J. Reed, S.X. Liu, and N.A. El-Masry (1999) Appl. Phys. Lett. 75, 2776.
Parkinson, P., D. Lim, J.G. Ekerdt, and M.C Downer (1999) Appl. Phys. B 68, 1.
Postigo, A., G. Armelles, and F. Briones (1998) Phys. Rev. B 58, 9659.
Poulopoulos, P., U. Bovensiepen, M. Farle, and K. Baberschke (1998) Phys. Rev. B 57, 14036.
Rho, H., H.E. Jackson, and B.L. Weiss (1999) Appl. Phys. Lett. 75, 1287.
Sano, H. and S. Ushioda (1996) Phys. Rev. B 53, 1958.
Shaofeng, W., Z. Wang, and S. Zou (1998) Phys. Rev. B 57, 7305.
Sun, L., Y.F. Chen, L. He, CZ. Ge, D.S. Ding, T. Yu, M.S. Zhang, N.B. Ming (1997) Phys. Rev. B 55, 12218.
Tsang, J.C. (1989) in Light Scattering in Solids V, eds. M. Cardona and G. Güntherodt, vol.66 in Topics in Applied Physics, Springer, Berlin, Heidelberg, p.233.
Walser, P., M. Hunziker, T. Speck, and M. Landolt (1999) Phys. Rev. B 60, 4082.
Wang, D.P., K.R. Wang, K.F. Huang, T.C Huang, and A.K. Chu (1999) Appl. Phys. Lett. 74, 475.
Wentink, D.J., M. Kuijper, H. Wormeester, and A. van Silfhout (1997) Phys. Rev. B 56, 7679.
Wilson, P.T., Y. Jiang, O.A. Aktsipetrov, E.D. Mishina, and M.C. Downer (1999) Opt. Lett. 24, 496.
Wüchner, S., J.C Toussaint, and J. Voirou (1997) Phys. Rev. B 55, 11576.
Zhou, S.M., K. Liu, and CL. Chien (1998) Phys. Rev. B 58, 14717.
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 2002 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Dragoman, D., Dragoman, M. (2002). Optical Properties of Interfaces and Thin Films. In: Optical Characterization of Solids. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-04870-2_5
Download citation
DOI: https://doi.org/10.1007/978-3-662-04870-2_5
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-07521-6
Online ISBN: 978-3-662-04870-2
eBook Packages: Springer Book Archive