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Inelastic Electron Scattering and Spectroscopy

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Abstract

This chapter describes several physical processes by which electrons are scattered inelastically. In order of increasing energy loss, E, these inelastic processes are:

  • phonon creation,

  • plasmon excitation,

  • core electron excitation.

Energy is conserved for all these inelastic processes — the spectrum of energy gains by the sample is mirrored in the spectrum of energy losses of the high-energy electrons.

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Further Reading

  • C. C. Ahn and O. L. Krivanek: EELS Atlas (Gatan, Inc., Pleasanton, CA 1983).

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  • M. M. Disko, C. C. Ahn and B. Fultz, Eds.: Transmission Electron Energy Loss Spectroscopy in Materials Science (Minerals, Metals & Materials Society, Warrendale, PA 1992).

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  • R. F. Egerton: Electron Energy-Loss Spectroscopy in the Electron Microscope 2nd Ed. (Plenum Press, New York 1996).

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  • J. J. Hren, J. I. Goldstein and D. C. Joy, Eds.: Introduction to Analytical Electron Microscopy (Plenum Press, New York 1979).

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  • D. C. Joy, A. D. Romig Jr. and J. I. Goldstein, Eds.: Principles of Analytical Electron Microscopy (Plenum Press, New York 1986).

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  • H. Raether: Excitations of Plasmons and Interband Transitions by Electrons (Springer-Verlag, Berlin and New York 1980).

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  • L. Reimer, Ed.: Energy-Filtering Transmission Electron Microscopy (Springer-Verlag, Berlin 1995).

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  • L. Reimer: Transmission Electron Microscopy: Physics of Image Formation and Microanalysis, 4th Ed. (Springer-Verlag, New York 1997).

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  • P. Schattchneider: Fundamentals of Inelastic Electron Scattering (Springer-Verlag, Vienna, New York 1986).

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  • D. B. Williams: Practical Analytical Electron Microscopy in Materials Science (Philips Electron Instruments, Inc., Mahwah, NJ 1984).

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  • D. B. Williams and C. B. Carter: Transmission Electron Microscopy: A Textbook for Materials Science (Plenum Press, New York 1996).

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References and Fingures

  1. D. H. Pearson: Measurements of White Lines in Transition Metals and Alloys using Electron Energy Loss Spectrometry. Ph.D. Thesis, California Institute of Technology, California (1991). Figure reprinted with the courtesy of Dr. D. H. Pearson.

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  2. M. M. Disko: ‘Transmission Electron Energy-Loss Spectrometry in Materials Science’. In: Transmission Electron Energy Loss Spectroscopy in Materials Science, ed. by M. M. Disko, C. C. Ahn and B. Fultz (Minerals, Metals & Materials Society, Warrendale, PA 1992). Reprinted with courtesy of The Minerals, Metals & Materials Society.

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  3. J. K. Okamoto: Temperature-Dependent Extended Electron Energy Loss Fine Structure Measurements from K, L 23, and M 45 Edges in Metals, Intermetallic Alloys, and Nanocrystalline Materials. Ph.D. Thesis, California Institute of Technology, California (1993). Figure reprinted with the courtesy of Dr. J. K. Okamoto.

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  5. R. F. Egerton: Electron Energy-Loss Spectroscopy in the Electron Microscope, 2nd edn. (Plenum Press, New York 1996). Figures reprinted with the courtesy of Plenum Press.

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  6. D. B. Williams and C. B. Carter: Transmission Electron Microscopy: A Textbook f or Materials Science (Plenum Press, New York 1996). Figure reprinted with the courtesy of Plenum Press.

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  7. R. D. Leapman: ‘EELS Quantitative Analysis’. In: Transmission Electron Energy Loss Spectroscopy in Materials Science ed. by M. M. Disko, C. C. Ahn and B. Fultz (Minerals, Metals & Materials Society, War-rendale, PA 1992). Reprinted with courtesy of The Minerals, Metals & Materials Society.

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  8. Figure reprinted with the courtesy of K. T. Moore.

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  9. D. B. Williams: Practical Analytical Electron Microscopy in Materials Science (Philips Electron Optics Publishing Group, Mahwah, NJ 1984). Figure reprinted with the courtesy of FEI/Philips.

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  10. E. H. S. Burhop: The Auger Effect and Other Radiationless Transitions (Cambridge University Press 1952). Figure reprinted with the permission of Cambridge University Press.

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  11. Figure reprinted with the courtesy of Dr. K. M. Krishnan.

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  12. Figure reprinted with the courtesy of C. M. Garland.

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  13. C. Nockolds, M. J. Nasir, G. Cliff and G. W. Lorimer, In: Electron Microscopy and Analysis — 1979, ed. by T. Mulvey (The Institute of Physics, Bristol and London, 1980) p. 417.

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  14. J. M. Howe and R. Gronsky: Scripta Metall., 20, 1168 (1986). Figure reprinted with the courtesy of Elsevier Science Ltd.

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© 2001 Springer-Verlag Berlin Heidelberg

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Fultz, B., Howe, J.M. (2001). Inelastic Electron Scattering and Spectroscopy. In: Transmission Electron Microscopy and Diffractometry of Materials. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-04516-9_4

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  • DOI: https://doi.org/10.1007/978-3-662-04516-9_4

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-04518-3

  • Online ISBN: 978-3-662-04516-9

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